2020
DOI: 10.1049/mnl.2020.0108
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Determination of Hamaker constant for CNT and AFM probe configuration inside SEM

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Cited by 3 publications
(1 citation statement)
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“…However, once the electrical contact is established, the contact parameters and the nanodevices properties are unchangeable. A simple and effective probe directly contact method is proposed through the AFMSEM based nanoscale manipulation robotic system [ 24 , 25 ] to characterize the electrical conductivity of MWCNT bundles [ 8 , 16 , 17 , 19 , 26 , 27 ]. The voltage current characteristic curves measured at the naturally formed contact and tip directly contact are influenced by the nanoscale interface contact behaviors.…”
Section: Introductionmentioning
confidence: 99%
“…However, once the electrical contact is established, the contact parameters and the nanodevices properties are unchangeable. A simple and effective probe directly contact method is proposed through the AFMSEM based nanoscale manipulation robotic system [ 24 , 25 ] to characterize the electrical conductivity of MWCNT bundles [ 8 , 16 , 17 , 19 , 26 , 27 ]. The voltage current characteristic curves measured at the naturally formed contact and tip directly contact are influenced by the nanoscale interface contact behaviors.…”
Section: Introductionmentioning
confidence: 99%