Determination of film thickness and refractive index by interferometry

Shabana, H.M.

doi:10.1016/j.polymertesting.2004.01.006

Cited by 27 publications

(16 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Such measurements can be made only with image-analyzing techniques, which are accurate, but time demanding [1]. In recent years, the use of fast and powerful nondestructive methods such as interferometry [2] or spectroscopic methods (NIR, FTIR, Terahertz) has come into focus [3], which can be used for on line monitoring of the technological process [4,5], particularly as regards tablet coatings. In the case of pellet systems, this measurement is more problematic due to the size ratio of the particles and the laser spot.…”

Section: Introductionmentioning

confidence: 99%

Raman spectroscopic investigation of film thickness

et al. 2009

View full text Add to dashboard Cite

a b s t r a c tThe determination of film thickness is of prime importance in the quality assurance of coated pharmaceutical preparations. The rapid measurement of this parameter is problematic for multi-particulate pellet systems. The aim of this study was to apply the Raman spectroscopic method for the determination of the thickness of polymer coating on pellets. The change of Raman intensity was compared with measured film thickness, which was calculated from the change of the geometric parameters of the pellets, measured with an image-analyzing system. The results revealed that despite some difficulties Raman spectroscopy is a suitable method for the fast and accurate determination of film thickness on multi-particulate systems.

show abstract

Section: Introductionmentioning

confidence: 99%

Raman spectroscopic investigation of film thickness

et al. 2009

View full text Add to dashboard Cite

show abstract

“…This complicates significantly the calculation of the distance between fringes, and thus the film thickness. Recently, the helical conjugate field function (HCF) has been utilized in coherence correlation interferometry to circumvent this limitation [8,9,10].…”

Section: Existing Knowledgementioning

confidence: 99%

Thickness Measurement of Photoresist Thin Films Using Interferometry

Kossivas¹,

Doumanidis²,

Kyprianou³

2012

Interferometry - Research and Applications in Science and Technology

View full text Add to dashboard Cite

“…If the diameter of the particle is larger than the film thickness, the particle generally will be pushed forward by the interface and cannot be engulfed by the moving interface. Interferometer [29] was utilized to measure the air-liquid interface film thickness. As showed in Fig.…”

Section: Air-liquid Interface Film Thicknessmentioning

confidence: 99%