2018
DOI: 10.1007/s11082-018-1635-5
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Determination of electrical parameters of ZnO/Si heterojunction device fabricated by RF magnetron sputtering

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Cited by 17 publications
(10 citation statements)
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“…This extraction of electrical parameters is referred to as the standard I-V method. Cheung-Cheung has also been used [63]. The parameters are determined by the following functions derived from I-V characteristics, as detailed in [63]:…”
Section: Current-voltage Measurementsmentioning
confidence: 99%
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“…This extraction of electrical parameters is referred to as the standard I-V method. Cheung-Cheung has also been used [63]. The parameters are determined by the following functions derived from I-V characteristics, as detailed in [63]:…”
Section: Current-voltage Measurementsmentioning
confidence: 99%
“…Cheung-Cheung has also been used [63]. The parameters are determined by the following functions derived from I-V characteristics, as detailed in [63]:…”
Section: Current-voltage Measurementsmentioning
confidence: 99%
See 2 more Smart Citations
“…17,18 The results might be induced by the obtained high resistivity and series resistance. [19][20][21] Moreover, ZnO and NiO have much lower concentrations and mobilities of carriers than silicon that rarely exceed 10 cm 2 Vs −1 . [22][23][24] Therefore, we considered as a solution doping ZnO with high concentrations of NiO.…”
mentioning
confidence: 99%