1996
DOI: 10.1103/physrevb.54.2028
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Determination of deformation potentials in ZnSe/GaAs strained-layer heterostructures

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Cited by 10 publications
(4 citation statements)
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“…We compare our values for the parameters a and b with different data from other authors and discuss systematic errors. Whereas our value for the parameter a = 5.3 ± 0.4 eV well reproduces the values of [1] and [2], the parameter b = −1.0 ± 0.1 eV nearly coincides with [4], [6] and [7] (for low pressure). We discuss the ratio a/b (determined from α/β) because this is (in our measurements) the most reliable value.…”
Section: Discussionsupporting
confidence: 72%
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“…We compare our values for the parameters a and b with different data from other authors and discuss systematic errors. Whereas our value for the parameter a = 5.3 ± 0.4 eV well reproduces the values of [1] and [2], the parameter b = −1.0 ± 0.1 eV nearly coincides with [4], [6] and [7] (for low pressure). We discuss the ratio a/b (determined from α/β) because this is (in our measurements) the most reliable value.…”
Section: Discussionsupporting
confidence: 72%
“…In figure 9 the lighthole exciton energy is plotted as a function of the heavyhole energy. The data points were taken from different papers [2,[4][5][6][7]19] at p = 1 bar and T ≈ 10 K. The ZnSe layers are biaxially (tensile and compressive respectively) strained by GaAs. From our results we expect a linear dependence with the slope E lh / E hh = 3.0 (broken line: fitted to the bulk value 2804 eV).…”
Section: Discussionmentioning
confidence: 99%
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