Determination of 239Pu and 241Am LX-ray intensities using a Simplex method for fitting peaks

Bland, C. J.; Morel, Jean‐Michel; Etcheverry, E.; Lépy, Marie‐Christine

doi:10.1016/0168-9002(92)90176-5

Cited by 25 publications

(5 citation statements)

References 9 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…Each L X-ray peak area was normalized by the area of the 59.5 keV γ -ray from the reliable data of emission intensities evaluated from nuclear physics analysis. An emission intensity for these γ -rays of 36.03% was multiplied by the normalized values [7]. Table 1 shows a comparison of the L X-ray emission intensities obtained with published data [2].…”

Section: Estimation Of L X-ray Emmision Intensitiesmentioning

confidence: 99%

Spectroscopic Measurement of L X-Rays Emitted by 241Am Source by TES Microcalorimeter

et al. 2012

View full text Add to dashboard Cite

Nondestructive plutonium monitoring during reprocessing of spent nuclear fuel and in mixed-oxide-fuel fabrication facilities is expected to require spectroscopic measurements of L X-rays ranging from 10 to 20 keV. To this end, L X-ray emission intensities of transuranium elements will be important parameters in estimating the plutonium isotopic composition from L X-ray spectra. However, owing to fine structure within the L X-ray spectra, significant discrepancies exist among theoretical values, reference and experimental data concerning these emission intensities. To obtain better spectroscopic measurements, we used a TES microcalorimeter to get the energy spectrum of L X-rays emitted by 237 Np resulting from α-decay of a 241 Am source. Values for the L X-ray emission intensities were estimated by analyzing the spectral data and compared with previous data. We advocate for improvements in evaluation of emission intensities given the enhanced precision afforded by TES microcalorimetry. J Low Temp Phys (2012) 167:754-758 755 Fig. 1 L X-ray energy spectra for 237 Np (a) and 235 U (b) measured by a semiconductor detector. Dashed lines indicate experimental results, solid lines are derived from theoretical calculations

show abstract

Section: Estimation Of L X-ray Emmision Intensitiesmentioning

confidence: 99%

Spectroscopic Measurement of L X-Rays Emitted by 241Am Source by TES Microcalorimeter

et al. 2012

View full text Add to dashboard Cite

show abstract

“…We have set a radioactive 241 Am source in front of each detector and recorded the 237 Np L X lines and γ-rays whose energies range from 10 to 60 keV, coming from alpha decay of 241 Am atoms. The interest of using such a source lies in the precise knowledge of emission probabilities of almost 20 transitions 17,18,19 . In practice, the recorded spectrum is characterized by four groups of Np X L emission lines, i.e., L l , L α , L β and L γ and four main gamma rays as shown in Fig 5 where…”

Section: B High Energy Region Above 10 Kevmentioning

confidence: 99%

2 E 1 Ar17+ decay and conventional radioactive sources to determine efficiency of semiconductor detectors

Lamour¹,

Prigent²,

Eberhardt³

et al. 2009

Review of Scientific Instruments

View full text Add to dashboard Cite

Although reliable models may predict the detection efficiency of semiconductor detectors, measurements are needed to check the parameters supplied by the manufacturers namely the thicknesses of dead layer, beryllium window and crystal active area. The efficiency of three silicon detectors has been precisely investigated in their entire photon energy range of detection. In the 0 to a few keV range, we have developed a new method based on the detection of the 2E1 decay of the metastable Ar 17+ 2s→1stransition. Very good theoretical knowledge of the energetic distribution of the 2E1 decay mode enables precise characterization of the absorbing layers in front of the detectors. In the high-energy range (> 10 keV), the detector crystal thickness plays a major role in the detection efficiency and has been determined using a 241 Am source.

show abstract

“…To process all the peaks on the desired energy range, an extrapolation to low energies is realized. This extrapolation allows thereafter to obtain the value of the preponderant scattered rays energy for each incident energy inversing equation (4).…”

Section: A Position Of Scattered Rays E Scamentioning

confidence: 99%

“…AM XLβ DETAILED ENERGY DATA[4] The used calibration certificate gives an outcoming flux at 17.5 keV including the XLη peak. Thus, this peak is taken into account in the processing.…”

mentioning

confidence: 99%

Activity measurement <sup>103</sup>Rh<sup>m</sup> X-ray emitting radio-isotope: Application to experimental programs carried out in the CEA critical facilities

Domergue

Béretz

Girard

et al. 2009

2009 1st International Conference on Advancements in Nuclear Instrumentation, Measurement Methods and Their Applications

View full text Add to dashboard Cite

International benchmarks for cross-sections qualification are very poor in experimental means able to provide information on the neutron spectrum around 1 MeV. To fill this vacancy, one possible solution is to use the activation of rhodium. The reaction of inelastic neutron scattering on this element, in the energy range of 0.5 MeV to 5 MeV, leads to the formation of 103 Rh m . The return to the ground level of this radionuclide emits X-rays of low energy. This paper describes a method for determining the activity of 103 Rh m taking into account the constraining characteristics of this radionuclide and proposes a computed to measured results comparison for an experiment irradiated in the French CEA critical facility EOLE. Index Terms-efficiency calibration, 103 Rh m , X-ray measurement, scattered rays, escape rays. K α Bump scattered Raie K α = 20,17 keV Raie K α1 = 20,22 keV Raie K α2 = 20,07 keV K β bump scattered Raie K β2 23,20 keV Raie K β1 22,81 keV Raie K β = 22,87 keV K α Bump scattered Raie K α = 20,17 keV Raie K α1 = 20,22 keV Raie K α2 = 20,07 keV K β bump scattered Raie K β2 23,20 keV Raie K β1 22,81 keV Raie K β = 22,87 keV

show abstract

Determination of 239Pu and 241Am LX-ray intensities using a Simplex method for fitting peaks

Cited by 25 publications

References 9 publications

Spectroscopic Measurement of L X-Rays Emitted by 241Am Source by TES Microcalorimeter

Spectroscopic Measurement of L X-Rays Emitted by 241Am Source by TES Microcalorimeter

2 E 1 Ar17+ decay and conventional radioactive sources to determine efficiency of semiconductor detectors

Activity measurement <sup>103</sup>Rh<sup>m</sup> X-ray emitting radio-isotope: Application to experimental programs carried out in the CEA critical facilities

Contact Info

Product

Resources

About