2011
DOI: 10.1016/j.physc.2011.05.117
|View full text |Cite
|
Sign up to set email alerts
|

Detection of smaller Jc region and damage in YBCO coated conductors by using permanent magnet method

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
5

Citation Types

0
14
0

Year Published

2012
2012
2022
2022

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 23 publications
(14 citation statements)
references
References 7 publications
0
14
0
Order By: Relevance
“…Recently, Hattori et al have proposed a contactless and a high-speed measuring methods of j C in an HTS film [8]. In the following, this is called a scanning permanent magnet method.…”
Section: Introductionmentioning
confidence: 99%
“…Recently, Hattori et al have proposed a contactless and a high-speed measuring methods of j C in an HTS film [8]. In the following, this is called a scanning permanent magnet method.…”
Section: Introductionmentioning
confidence: 99%
“…Since physical properties of HTS films are remarkably degraded by cracks, crack detection is essential in a production process of largesized HTS films. For this reason, two types of contactless and nondestructive methods have been applied to crack detection: permanent-magnet method [1]- [3] and inductive method [4]- [6]. Although both of them are originally powerful methods for measuring the critical current density j C in HTS films, they are extremely time-consuming.…”
Section: Introductionmentioning
confidence: 99%
“…Hattori et al [3] improved the permanent-magnet method to drastically shorten the measurement time. In the improved method, while a permanent magnet is moved along a film surface, an electromagnetic force acting on the film is measured.…”
Section: Introductionmentioning
confidence: 99%
“…This is mainly because F M must be determined at each measurement point. For the purpose of resolving this problem, Hattori et al [5] improved the permanent-magnet method. In the improved method, the magnet is moved along the film surface and, simultaneously, the electromagnetic force F z acting on the film is measured.…”
Section: Introductionmentioning
confidence: 99%