1989
DOI: 10.1007/bf02847388
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Detection of excess crystalline As in GaAs: Nation oxide overlayers by Raman scattering

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Cited by 4 publications
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“…Similar results were found on all the investigated nanowires, with pure zinc-blende as well as zinc-blende/wurtzite structure, with high reproducibility. The formation of crystalline As due to heating of GaAs has already been observed and studied under several different experimental conditions [20][21][22][23]. It was proposed that the formation of crystalline As on GaAs films is mediated by the formation of arsenic oxide, which decomposes at the oxide/GaAs interface following the thermally induced interfacial solid-solid reaction As 2 O 3 (s) + 2GaAs(s) → Ga 2 O 3 (s) + 4As(s) [20].…”
Section: Resultsmentioning
confidence: 99%
“…Similar results were found on all the investigated nanowires, with pure zinc-blende as well as zinc-blende/wurtzite structure, with high reproducibility. The formation of crystalline As due to heating of GaAs has already been observed and studied under several different experimental conditions [20][21][22][23]. It was proposed that the formation of crystalline As on GaAs films is mediated by the formation of arsenic oxide, which decomposes at the oxide/GaAs interface following the thermally induced interfacial solid-solid reaction As 2 O 3 (s) + 2GaAs(s) → Ga 2 O 3 (s) + 4As(s) [20].…”
Section: Resultsmentioning
confidence: 99%