2004
DOI: 10.1017/s1431927604887543
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Detecting Structural and Bonding Changes in EELS Near-Edge Structures with a Monochromated TEM

Abstract: The enhanced energy resolution in electron energy loss spectroscopy measurements achieved in transmission electron microscopes equipped with monochromators provides new opportunities for the study of the properties of materials and their defects with an unprecedented spatial resolution. The current systems offering an energy resolution comparable to the one of soft x-ray absorption spectroscopy (about 0.1eV) make it possible to increase the sensitivity to changes in the near-edge structure while maintaining th… Show more

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