“…The dielectric and electrorotation properties of S. cerevisiae have also been extensively investigated. Such studies include the effects of chemical exposure (Lopez et al 1984, 1985, Geier et al 1987, Arnold et al 1988a, b, Stoicheva et al 1989, Pauli et al 1993, Zhou et al 1996, differences between viable and non-viable yeast (Crane and Pohl 1968, Huang et al 1992 and changes in dielectric properties during batch culture (Arnold et al 1989, Kell et al 1990.…”