Detecting and describing the inhomogeneity of critical current in practical long HTS tapes using contact-free method

Wang, Yinshun; Lu, Y.; Xu, Xiaodong; Dai, Shaotao; Dong, Hui; Xiao, Liye; Lin, Liangzhen

doi:10.1016/j.cryogenics.2007.01.006

Cited by 18 publications

(12 citation statements)

References 14 publications

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“…After the external magnetic field is removed, the relative geometrical location and size of HTS tape, Hall probe, critical current I c are shown in Figure 1, where the direction of x axis is along the width of the tape, z axis refers to the vertical tape surface, the coordinate origin is at the tape center [24]. Then the magnetic field along z axis at location (±δ, h) above tape is described by…”

Section: Remanent Field Methodsmentioning

confidence: 99%

“…[24,34,44], yet there are a lot of test results using contact-free methods based on different principles. However, up to present, there is no report on real device for measurement of index n values by contact-free method.…”

Section: Weibull Statistical Methodsmentioning

confidence: 99%

“…The inhomogeneity of critical currents has important influence on design and operational efficiency of HTS electrical apparatus. Figure 11 presents the typical critical current distributions of 200 m-order HTS tapes in length after calibrating by contact-free method [24]. At present, there are no internationally unified standards for evaluating the inhomogeneity of critical currents and index n values in HTS tapes, but it is reasonable for design and development of HTS electrical apparatus to adopt statistical methods to analyze them.…”

Section: Inhomogeneous Analyses On Critical Currents and Index N Valumentioning

confidence: 99%

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Progress in inhomogeneity of critical current and index n value measurements on HTS tapes using contact-free method

Wang

Guan

Zhang

et al. 2010

Sci. China Technol. Sci.

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The development of high temperature superconducting (HTS) tapes has recently made great progress, and Bi-based tapes (1 G) and YBCO coated conductor (2 G) are commercially fabricated with practical length. Application of HTS in electric power apparatuses made important achievement, various superconducting devices were demonstrated in grid, laying solid foundation for their commercialization. However, since their intrinsic microscopic defects such as weak-link, granularity, small second phase likely exist, critical current and index n value of the HTS tapes in practical length are impossible homogeneous, which have significant influences on safety, stability and efficiency of the HTS apparatuses. Therefore, critical current and index n value are two important parameters describing inhomogeneity of HTS tapes, thus two important indices for evaluating quality of practical long HTS tapes. This paper focuses on main progresses in inhomogeneity of critical current and index n value measurements on HTS tapes using contact-free methods. The statistical analytical methods evaluating the inhomogeneity of critical current and index n value are suggested. They can provide essential references for design and operation of HTS apparatuses.critical current, contact-free measurement, high temperature superconducting (HTS) tapes, index n value Citation:Wang Y S, Guan X J, Zhang H Y, et al. Progress in inhomogeneity of critical current and index n value measurements on HTS tapes using contact-free method.

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Section: Remanent Field Methodsmentioning

confidence: 99%

Section: Weibull Statistical Methodsmentioning

confidence: 99%

Section: Inhomogeneous Analyses On Critical Currents and Index N Valumentioning

confidence: 99%

See 1 more Smart Citation

Progress in inhomogeneity of critical current and index n value measurements on HTS tapes using contact-free method

Wang

Guan

Zhang

et al. 2010

Sci. China Technol. Sci.

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“…[3][4][5][6][7][8][9][10][11][12][13][14][15][16][17] Under no applied strain, the critical current is different from specimen to specimen and from position to position within a specimen. [18][19][20][21][22][23][24] Under applied strain, the damage evolution behavior is also different from specimen to specimen and from position to position within a specimen, resulting in wider distribution of critical current. [12][13][14][15][16][17] It is necessary to find a suitable function for describing the critical current distribution of the bend-damaged specimens.…”

Section: Distribution Of Normalized Critical Current Of Bent Multifilmentioning

confidence: 97%

Distribution of normalized critical current of bent multifilamentary Bi2223 composite tape

Ochiai

Fujimoto

Shin

et al. 2009

Journal of Applied Physics

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The distribution of the normalized critical transport current (critical current normalized with respect to the original value) of Bi2223/Ag/Ag alloy composite tape under bending strain of 0%–0.833% was studied experimentally and analytically. The experimental results were analyzed by a modeling approach based on the relation of the heterogeneous damage evolution to the distribution of the critical current. The main results are summarized as follows. (1) The measured distribution of the critical current values varying with bending strain was described well by the present approach. (2) When all specimens were damaged at high bending strains (0.338%–0.833% in the present work), the distribution of the critical current of the bent-damaged specimens was expressed by the three-parameter Weibull distribution function, the reason for which was revealed. (3) The distribution of the irreversible strain was estimated, with which the influence of the increase in the fraction of damaged specimens on the variation of critical current distribution in the low bending strain range (0%–0.35%) was elucidated.

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“…1- 26 Also it has been known that the critical current is different from position to position in a specimen and from specimen to specimen. [19][20][21][22][23][24][25][26][27][28][29][30][31][32] Accordingly, when many specimens are tested, the local and overall critical currents are distributed, especially under the applied strain ͑Ͼ the irreversible strain͒ due to the inhomogeneous damage evolution. [19][20][21][22][23][24][25][26] It is needed to reveal the statistical features of the local and overall critical transport current distributions and the relation of overall critical current distribution to local one especially under various applied strains, which are important items for reliability and safe design.…”

Section: Introductionmentioning

confidence: 99%

Simulation on the relation of distribution of overall critical transport current to that of local one in bent-damaged Bi2223 superconducting composite tape

Ochiai

Fujimoto

Okuda

et al. 2009

Journal of Applied Physics

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Detecting and describing the inhomogeneity of critical current in practical long HTS tapes using contact-free method

Cited by 18 publications

References 14 publications

Progress in inhomogeneity of critical current and index n value measurements on HTS tapes using contact-free method

Progress in inhomogeneity of critical current and index n value measurements on HTS tapes using contact-free method

Distribution of normalized critical current of bent multifilamentary Bi2223 composite tape

Simulation on the relation of distribution of overall critical transport current to that of local one in bent-damaged Bi2223 superconducting composite tape

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