2001
DOI: 10.1109/19.982953
|View full text |Cite
|
Sign up to set email alerts
|

Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2013
2013
2017
2017

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 17 publications
0
2
0
Order By: Relevance
“…Therefore, combining (5), (8), and (9) makes possible to express the X-ray beam attenuation in human body as function of X and ESD μ · x = − ln…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…Therefore, combining (5), (8), and (9) makes possible to express the X-ray beam attenuation in human body as function of X and ESD μ · x = − ln…”
Section: Methodsmentioning
confidence: 99%
“…In digital radiography, instead, under-or over-exposure does not occur, because of its wider dynamic range [7], [8]. This can lead to the possibility that patients receive an excessive radiation dose with respect the exposure necessary for providing diagnostically acceptable images.…”
Section: Introductionmentioning
confidence: 95%