2022
DOI: 10.1109/ted.2022.3196327
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Detailed Study on the Role of Nature and Distribution of Pinholes and Oxide Layer on the Performance of Tunnel Oxide Passivated Contact (TOPCon) Solar Cell

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Cited by 8 publications
(5 citation statements)
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“…A more detailed analysis on the dependencies on pinhole and tunnel oxide has been done in the previous work. [ 34 ]…”
Section: Resultsmentioning
confidence: 99%
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“…A more detailed analysis on the dependencies on pinhole and tunnel oxide has been done in the previous work. [ 34 ]…”
Section: Resultsmentioning
confidence: 99%
“…Pinholes are formed in the thin oxide layer during the growth or annealing, [31][32][33] play a crucial role in carrier transport through tunnel oxide layer. [34] In practice pinholes formed in the tunnel oxide layer are not uniform, the radii vary in the range 2-40 nm, and density varies in the range 10 5 -10 10 cm À2 . Also, for all the pinholes, poly-Si does not make direct contact with Si substrate rather a very thin oxide layer exists in between.…”
Section: Variation With Pinhole Radius Pinhole Density and Tunnel Oxi...mentioning
confidence: 99%
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“…Additionally to the above-mentioned problems, Potential-Induced Degradation (PID), Light-Induced Degradation (LID), and general degradation are indeed crucial concerns in the realm of PV technology, especially with the advent of modern advancements like the half-cut Passivated Emitter Rear Cell (PERC) [87,88] or Top Contact (TopCon cells) [89,90]. It may take a long time to detect the PID through traditional data analysis methods, resulting in an undetected energy loss [91].…”
Section: Typical Maintenance Issuesmentioning
confidence: 99%