Abstract:The focus is on the initial processes which change the shape of the bending S-N border during pulsed electrical S-N switching of thin YBaCuO films. These processes were noted on the SEM images of damaged films. The YBaCuO strip samples of high critical current densities were damaged by overcritical current pulses of nanosecond duration. The processes obtain different properties depending on the effective penetration length that the films have. During the N-zone propagation by the channel, led by the top unstab… Show more
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