2012
DOI: 10.1103/physrevb.86.045205
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Detailed calculation of the thermoelectric figure of merit in ann-doped SiGe alloy

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Cited by 14 publications
(32 citation statements)
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“…[13]; since this determination is fairly involved, we refer those who are interested to Ref. [11], in which it is discussed in detail, and focus on the details of the calculation in the case of superlattices in what follows.…”
Section: Methodsmentioning
confidence: 99%
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“…[13]; since this determination is fairly involved, we refer those who are interested to Ref. [11], in which it is discussed in detail, and focus on the details of the calculation in the case of superlattices in what follows.…”
Section: Methodsmentioning
confidence: 99%
“…[11]. The Interface Mixing scattering (IMS) rate τ −1 IMS (q q qs) arises from 'masssmudging' (the formation of dislocations is neglected here, for the superlattice under consideration is well below the critical length for their formation [14]); for this and the anharmonic scattering rate τ −1 AH (q q qs) we use the formulation from Ref.…”
Section: −1mentioning
confidence: 99%
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