Destructive Breakdown in Thin Films of SiO, MgF2, CaF2, CeF3, CeO2, and Teflon

Dielectric Breakdown in Solids

“…In the last section, evidence was presented from electron-molecule (gas) reactions that the average energy per atom when chemical bonds are broken is several electron volts. In the experimental observations of light emission during breakdown conduction in thin film capacitors, radiation in the ultraviolet is observed (a wavelength of 2000 X corresponds to 6.2 eV) [8]. Moreover, the observed spectrum is a line spectrum and not a thermal one and it is observed from the very beginning of breakdown conduction.…”

“…The light emission observed by Budenstein and his co-workers [8] was in thin film systems rather than bulk. Precursors were not observed, but the observations were made perpendicular to the plane of the capacitor system, not looking directly into the dielectric as was done in the bulk experiments.…”

“…The spectrum oi light emitted during this formation period has not been determined. However, in time-resolved spectroscopy of the light emitted during breakdown of AI-SiO-A1 and other thin film capacitor systems, Budenstein et al [8] obtained arc spectra, descriptive of atoms in the gaseous state, from the dissociated dielectric and electrode materials. These spectra were obtained from the instant that the voltage waveform indicated the onset of breakdown conduction.…”

“…It is easy to arrange circuit parameters in the thin film case so that the capacitor is effectively isolated from its voltage source during the time that breakdown is occurring. Examination of the waveform of the thin film capacitor accompanying breakdown shows that the voltage falls to a well-defined value for a particular capacitor and, whereas the voltage for the onset of breakdown fluctuates considerably, the voltage at which breakdown conduction ceases is much more narrowly defined [8]. The voltage is typically between 10 and 20 V, regardless of capacitor thickness (in the range 1000 to 10,000 A) or voltage polarity.…”

Dielectric breakdown weathering of the Moon's polar regolith

“…The required fluence (time‐integrated flux) of charged particles is ∼10 10 –10 11 cm −2 for breakdown in solids [ Frederickson et al , ; Violet and Frederickson , ; Garrett and Evans , ; Green and Dennison , ]. If these criteria are met, the dielectric atomizes and is converted to a plasma within small, filamentary, tree‐like channels [ Budenstein , ], which can be about 10 μm in diameter [ Budenstein et al , ]. As summarized by Budenstein [] and Frederickson et al [], breakdown within most solids typically occurs at ∼10 7 V/m.…”