Desorption of H atoms from graphite (0001) using XUV free electron laser pulses

Siemer, B.; Olsen, Thomas; Hoger, T.; Rutkowski, M.; Thewes, C.; Düsterer, S.; Schiøtz, Jakob; Zacharias, H.

doi:10.1016/j.cplett.2010.10.040

Cited by 6 publications

(7 citation statements)

References 16 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…38,60,61 The faster peak can be reconciled when one assumes that the desorption occurs out of a uniform para conguration of adsorbed H atoms. 58 In this conguration all H atoms are only adsorbed in a para position relative to each other on the graphene lattice. Thereby additional energy is gained by the adsorbate system, as depicted in Fig.…”

Section: Neutral Hydrogenmentioning

confidence: 99%

See 1 more Smart Citation

Free-electron laser induced processes in thin molecular ice

et al. 2014

View full text Add to dashboard Cite

Intermolecular reactions in and on icy films on silicate and carbonaceous grains constitute a major route for the formation of new molecular constituents in interstellar molecular clouds. In more diff use regions and in protoplanetary discs, energetic radiation can trigger reaction routes far from thermal equilibrium. As an analog of interstellar ice-covered dust grains, highly-oriented pyrolytic graphite (HOPG) covered with D2O, NO, and H atoms is irradiated by ultrashort XUV pulses and the desorbing ionic and neutral products are analysed. The yields of several products show a nonlinear intensity dependence and thus enable the elucidation of reaction dynamics by two-pulse correlated desorption.

show abstract

Section: Neutral Hydrogenmentioning

confidence: 99%

“…By changing the temporal delay between the probe and desorption laser pulses, an arrival time spectrum of the H atoms in the probe volume is recorded. 58 A er transformation into the velocity space, rather slow velocities for the desorbing hydrogen atoms are observed (see Fig. 8).…”

mentioning

confidence: 99%

Free-electron laser induced processes in thin molecular ice

et al. 2014

View full text Add to dashboard Cite

show abstract

“…Normally the set up is used for surface science experiments in the laboratory and at light sources like FLASH [7,8]. In order to avoid damage on the carbon coatings of the original Si mirror substrates an analogous substrate was coated in the same mirror coating process.…”

Section: Uhv Systemmentioning

confidence: 99%

“…Applying geometrical wave front beam splitting and an all-reflective optical design with grazing incidence angles of 3° and 6° at the mirrors the instrument is capable to handle the high power FLASH pulses with exceptional high efficiency up to 300 eV [5]. This SDU is a installed on BL2 at FLASH and applied to time-resolved measurements in atomic and cluster physics, as well as to determine the temporal structure of the FLASH pulses [6][7][8][9][10][11][12]. A typical carbon coated mirror substrate is shown in the inset of figure 1 (b).…”

Section: Introductionmentioning

confidence: 99%

Multiple free electron laser pulse illumination of a carbon coated silicon substrate

et al. 2013

View full text Add to dashboard Cite

The fourth generation of XUV-, soft x-ray-and x-ray-light sources, like the free electron lasers FLASH and FERMI@Elettra, leads to new seminal scientific findings and technical challenges. For the facilities the question of the beam transport is of utmost importance. To provide a good reflectivity over a large range of photon energies up to about 300 eV mostly carbon coated silicon mirrors illuminated under gracing incidence angle are mostly chosen. Thereby the coating for the mirrors must tolerate high light intensities at high photon energies and also high repetition rates. In the present experiment an amorphous carbon coated silicon substrate was illuminated at photon energies of 21 nm (58 eV) and an average pulse energy of ~27 µJ. The ellipsoidal spot size of 300 µm x 600 µm at FLASH leads to a fluence of 0.019 J/cm 2 . The influence of multiple (100 -20.000) light pulses to the coated surface is analyzed. Depending on the number of pulses a change in reflectivity is visible under a light microscope. Both an AFM profile and measurements with a profilometer yield no topological changes. The investigation of the illuminated spots with a microfocus Raman spectrometer shows a decrease of the carbon signal at higher pulse repetition rates.

show abstract

“…A number of experiments performed at the new X-FEL user facilities will not be described here in details. These include: desorption [94] and ablation [95] studies on solids, investigations of plasma [96,97] and cluster nanoplasma formation [98], time-resolved photoelectron imaging [99], near edge x-ray absorption fine structure spectroscopy [100], Thomson scattering [101] and many others. Since the number of published papers is increasing as we speak and due to space limitations we did not attempt to include all of the experimental results that are currently available in this review.…”

Section: Last But Not Leastmentioning

confidence: 99%

Status and prospects of x-ray free-electron lasers (X-FELs): a simple presentation

Ribič¹,

Margaritondo²

2012

J. Phys. D: Appl. Phys.

View full text Add to dashboard Cite

The first part of this topical review provides the reader with a conceptual background sufficient to understand the mechanism of an X-FEL without using any formalism. The discussion is thus accessible to non-specialized scientists from any discipline. Then, we review the present status of selected X-FEL projects throughout the world. Examples of actual experiments are used to illustrate the potential impact of these new, exciting sources at the forefront of photon technology.

show abstract

Desorption of H atoms from graphite (0001) using XUV free electron laser pulses

Cited by 6 publications

References 16 publications

Free-electron laser induced processes in thin molecular ice

Free-electron laser induced processes in thin molecular ice

Multiple free electron laser pulse illumination of a carbon coated silicon substrate

Status and prospects of x-ray free-electron lasers (X-FELs): a simple presentation

Contact Info

Product

Resources

About