2021
DOI: 10.1177/10775463211038140
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Designing nonlinear observer for topography estimation in trolling mode atomic force microscopy

Abstract: In this study, a nonlinear observer for high-speed estimation of the sample surface topography in a small duration of the probe transient motion utilizing a 2DOF model of TR-AFM is proposed. Since the time duration to reach the steady-state periodic motion of the oscillating probe in conventional imaging methods is relatively high, the proposed nonlinear observer in this research is able to address this limitation and estimate the surface topography throughout transient oscillation of the microcantilever. With… Show more

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Cited by 11 publications
(12 citation statements)
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References 33 publications
(44 reference statements)
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“…where 𝛼 ≥ 0 is called the Lagrange coefficient. Considering the Lagrange function, the form with the inequality condition of the quadratic problem (13) becomes the unconditioned form of the (15), which is called the initial Lagrange function.…”
Section: ‫)𝛼و𝑥(𝐿‬ = 𝑓(𝑥) + 𝛼𝑔(𝑥)mentioning
confidence: 99%
See 1 more Smart Citation
“…where 𝛼 ≥ 0 is called the Lagrange coefficient. Considering the Lagrange function, the form with the inequality condition of the quadratic problem (13) becomes the unconditioned form of the (15), which is called the initial Lagrange function.…”
Section: ‫)𝛼و𝑥(𝐿‬ = 𝑓(𝑥) + 𝛼𝑔(𝑥)mentioning
confidence: 99%
“…This classifier is actually a binary digital classifier [12]- [14], which has the ability to classify samples of multiple classes. It is also used to solve linear and non-linear problems [15]. The working basis of the SVM classifier is the linear classification of data, and in the linear division of the data, we try to choose a line that has a higher confidence margin.…”
Section: Introductionmentioning
confidence: 99%
“…In this article, an analysis was performed on the convection of a Newtonian fluid flow between two asymmetric parallel surfaces in a porous medium. Mondal [17] researched irreversibility minimization in a viscoelastic liquid flow [18–49]. The viscoelastic parameters, the Peclet number, and the temperature gradient were studied in this paper.…”
Section: Introductionmentioning
confidence: 99%
“…Atomic force microscopy (AFM) is a device used to study materials’ properties and surface structure in micro- and nanometer dimensions [ 1 , 2 , 3 ]. Flexibility, multiple potential signals, and the ability to operate the device in different modes have enabled researchers to study AFMs at different levels and under different environmental conditions.…”
Section: Introductionmentioning
confidence: 99%