2014
DOI: 10.1109/mdat.2013.2288252
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Designing Fault-Tolerant Photovoltaic Systems

Abstract: PV systems are subject to PV cell faults, which lower the output power and shorten the lifespan of the system. This article presents the design principles and runtime control algorithms of a fault-tolerant PV system which can detect and bypass PV cell faults in situ without any manual interventions.

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Cited by 27 publications
(6 citation statements)
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References 11 publications
(10 reference statements)
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“…44 One of the critical components of the CMOS-embedded PV module is the algorithm. 32,33,[37][38][39] The algorithm first detects the presence of partial shading conditions and then, based on the presence of shaded PV cells, determines the configuration that minimizes the effects of partial shading conditions. For making the reconfigurable PV panel much smarter, the algorithm used by them should be sensitive enough to detect the presence of shaded PV cells in the panel.…”
Section: Discussion and Future Workmentioning
confidence: 99%
See 3 more Smart Citations
“…44 One of the critical components of the CMOS-embedded PV module is the algorithm. 32,33,[37][38][39] The algorithm first detects the presence of partial shading conditions and then, based on the presence of shaded PV cells, determines the configuration that minimizes the effects of partial shading conditions. For making the reconfigurable PV panel much smarter, the algorithm used by them should be sensitive enough to detect the presence of shaded PV cells in the panel.…”
Section: Discussion and Future Workmentioning
confidence: 99%
“…Besides that, the embedded computing system will also generate and send the reset and clock signal to all APS switches present in the reconfigurable PV module. Over the years, many different kinds of embedded systems are used, such as computers, 32,33,37 field programmable gate array, 38,39 and Raspberry PI. 42 Algorithm.…”
Section: Photovoltaics Embedded With Cmos Switchesmentioning
confidence: 99%
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“…It also bypasses the defective module considering the power loss, which is more than the threshold value. However, it requires a massive number of switches and so false detection may happen between L‐L faults and temporary faults [22]. Silvestre et al.…”
Section: Introductionmentioning
confidence: 99%