2003
DOI: 10.1016/s0022-1139(03)00075-7
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Design of very transparent fluoropolymer resists for semiconductor manufacture at 157 nm

Abstract: Photolithography at 157 nm requires development of new photoresists that are highly transparent at this wavelength. Transparent fluoropolymer platforms have been identified which also possess other materials properties required for chemically amplified imaging and aqueous development. Polymers of tetrafluoroethylene (TFE), a fluoroalcohol-substituted norbornene and an acid-labile acrylate ester show the best combination of properties. A solution, semibatch, free-radical polymerization process was developed all… Show more

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Cited by 36 publications
(34 citation statements)
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References 16 publications
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“…We also expected that these substrates would have higher shear adhesion in air and in water than previous results on PTFE because of the reduction of roughness in this study [19][20][21][22][23]. Our second hypothesis was that shear adhesion will vary based on the degree of fluorination, where a fully fluorinated substrate ( perfluorinated, such as fluorinated ethylene propylene (FEP)) will have lower shear adhesion values in air and in water than a partially fluorinated substrate (such as ethylene tetrafluoroethylene (ETFE)) [24,25]. Likewise, we hypothesized that our control, non-fluorinated substrate, will have no difference in shear adhesion in water and in air, corresponding to our previous results on hydrophobic, non-fluorinated substrates.…”
Section: Introductionmentioning
confidence: 69%
“…We also expected that these substrates would have higher shear adhesion in air and in water than previous results on PTFE because of the reduction of roughness in this study [19][20][21][22][23]. Our second hypothesis was that shear adhesion will vary based on the degree of fluorination, where a fully fluorinated substrate ( perfluorinated, such as fluorinated ethylene propylene (FEP)) will have lower shear adhesion values in air and in water than a partially fluorinated substrate (such as ethylene tetrafluoroethylene (ETFE)) [24,25]. Likewise, we hypothesized that our control, non-fluorinated substrate, will have no difference in shear adhesion in water and in air, corresponding to our previous results on hydrophobic, non-fluorinated substrates.…”
Section: Introductionmentioning
confidence: 69%
“…P-acetoxystyrene (AcOST), which has been employed in the past as a key component in 248-nm photoresists [68], exhibited the best controlling ability based on the lowest dispersity ( � � ⁄ ~ 1.29) at a concentration as low as 5 mol% in the feed. Pentafluorostyrene (PFS), also offering relatively good control ( � � ⁄ ~ 1.47 and 1.31 for 5 and 10 mol% in the feed, respectively), is of interest, because fluorinated polymers have been shown to be good candidates for both 157-nm and 193-nm photoresists, due to their low absorption, good etch resistance properties [69][70][71][72][73] and high hydrophobicity [74,75], which is especially important in immersion lithography. 2-vinyl naphthalene (VN) was also an effective co-monomer in being able to produce copolymers with low dispersities ( � � ⁄~ 1.3) with as low as 5 mol% in the feed.…”
Section: Characterization Of Nlam/x Statistical Copolymersmentioning
confidence: 99%
“…The polymer also functions to control solution viscosity. Another function is to support film forming and to increase mechanical properties of resulted photoresist liquid 11 . The photoresist appplications in microelectronic industry range very wide area.…”
Section: Introductionmentioning
confidence: 99%