Design of thin-film tape heads

Ruigrok, J.J.M.; Draaisma, E.A.; Kesteren, H.W. van

doi:10.1016/s0165-5817(97)00008-9

Cited by 8 publications

(2 citation statements)

References 20 publications

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“…The heads chosen for use in this study were regular ADR thin-film yoke-type MR heads [10] possessing eight channels. The presence of eight channels allows a systematic study of the performance of channels with poles trimmed to different widths without the need to remove the head from the SMRM setup.…”

Section: Fib Trimming Of Flux Guides and Reconstruction Of Tbsmentioning

confidence: 99%

“…Finite-element modeling is an important tool in the development of magnetic read/write heads as the effect of new design features on head performance may be assessed prior to the manufacture of prototypes [10]. Previously, using two-dimensional (2-D) FEM software, trimmed channels were modeled in the cross-track plane; however, the results of this modeling were far from agreement with experiment [18].…”

Section: Finite-element Modelingmentioning

confidence: 99%

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Performance of focused ion beam trimmed yoke-type magnetoresistive heads for magnetic microscopy

Phillips

Eisenberg²,

Draaisma³

et al. 2002

IEEE Trans. Magn.

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Thin-film yoke-type magnetoresistive (MR) tape heads with eight channels have been used for scanning magnetoresistance microscopy. The NiFe read flux guides of the channels have been trimmed down from 12 m to widths varying between 5 m and 100 nm by focused ion-beam milling with Ga + ions. The tape-bearing surface of the milled regions has been reconstructed in situ by the local deposition of Pt. Tracks with a minimum bit length of 1 m have been written on Co-Ni-O metal evaporated tape and Co-Fe 2 O 3 particulate tape with trimmed and untrimmed write channels and have been successfully imaged with all the trimmed read channels. A linear decrease in readback voltage across the MR sensor is observed for channels possessing flux guides trimmed down to 2 m, in agreement with finite-element modeling of the trimmed heads. The severe attenuation in readback voltage observed for flux guides trimmed below 2 m is attributed to a combination of micromagnetic effects. Additionally, damage to the NiFe from Ga + ion implantation may make a minor contribution to the loss in sensor performance. A 65% drop in readback voltage is observed for a channel possessing a flux guide that was trimmed by 98.3% to 200 nm.

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Section: Fib Trimming Of Flux Guides and Reconstruction Of Tbsmentioning

confidence: 99%

Section: Finite-element Modelingmentioning

confidence: 99%