Design of SEL Self-Recovery Hardness for 90nm COTS Devices Using R-C-S Network with DC-DC Converter

Xin, Jindou; Zhu, Xiang; Ma, Yingqi; Han, Jianwei

doi:10.1109/apccas55924.2022.10090280

2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) 2022

DOI: 10.1109/apccas55924.2022.10090280

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Design of SEL Self-Recovery Hardness for 90nm COTS Devices Using R-C-S Network with DC-DC Converter

Jindou Xin

Xiang Zhu

Yingqi Ma

et al.

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Design of SEL Self-Recovery Hardness for 90nm COTS Devices Using R-C-S Network with DC-DC Converter

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References 14 publications

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