2000
DOI: 10.1016/s0921-5107(99)00272-x
|View full text |Cite
|
Sign up to set email alerts
|

Design of porous silicon antireflection coatings for silicon solar cells

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
43
0

Year Published

2000
2000
2014
2014

Publication Types

Select...
5
2
1

Relationship

0
8

Authors

Journals

citations
Cited by 78 publications
(43 citation statements)
references
References 12 publications
0
43
0
Order By: Relevance
“…1) and theoretical ( Fig. 2) reflectance spectrum of the double-layer porous silicon [7], where the parameters of layers for theoretical calculation are given (see [7], Table1), and experimental reflectance spectrum of SiO 2 /TiO 2 ARCs (Fig. 3) [8].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…1) and theoretical ( Fig. 2) reflectance spectrum of the double-layer porous silicon [7], where the parameters of layers for theoretical calculation are given (see [7], Table1), and experimental reflectance spectrum of SiO 2 /TiO 2 ARCs (Fig. 3) [8].…”
Section: Resultsmentioning
confidence: 99%
“…2 Comparison of theoretical reflectance spectrum of double-layer ARC proposed by (solid line) us and given in [7] (dash-dotted line).…”
Section: Resultsmentioning
confidence: 99%
“…2, an increase in PS formation time leads to the transformation of reflection spectra, and for the investigated samples, its minimum slowly shifts from 400 to 750 nm. This shift of reflectivity minimum is generally related to the growth of porous layer thickness according to the relation n eff d por ¼ l min /4 (n eff is the effective refractive index of PS, d por is the PS layer thickness, l min is the wavelength corresponding to the minimum of the reflection spectra) [18]. In addition, as shown in Fig.…”
Section: Methodsmentioning
confidence: 99%
“…The theoretical requirements for the design of single-and double-layer PS as antireflection coating on silicon solar cell are given (Strehlke et al 1999(Strehlke et al , 2000.…”
Section: Reflectance Of Porous Siliconmentioning
confidence: 99%