2021 International Conference on Machine Learning and Intelligent Systems Engineering (MLISE) 2021
DOI: 10.1109/mlise54096.2021.00021
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Design of LQFP chip pin defect detection system based on machine vision

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Cited by 2 publications
(2 citation statements)
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“…Feature extraction is a key step in image processing and classification, extracting texture and geometric feature vectors of defects for analysis [2]. The surface defect image of the crankshaft is a data set composed of pixels [3]. In feature extraction, the common features of target objects are found in the image to provide the basis for image classification.…”
Section: Surface Defect Characterizationmentioning
confidence: 99%
“…Feature extraction is a key step in image processing and classification, extracting texture and geometric feature vectors of defects for analysis [2]. The surface defect image of the crankshaft is a data set composed of pixels [3]. In feature extraction, the common features of target objects are found in the image to provide the basis for image classification.…”
Section: Surface Defect Characterizationmentioning
confidence: 99%
“…Li et al [19] proposed a gray-scale feature-based template matching method for connector pin skew detection, with a detection accuracy better than 0.06 mm, but the method is cumbersome and computationally intensive, and requires the production of different connector pin templates. Ou et al [20] proposed a fast segmentation algorithm based on dynamic thresholding to obtain chip feature images, and designed a pin defect detection method based on gray-scale jump detection. This method uses a point set alignment algorithm to calculate the pin deviation, which is computationally complex and susceptible to interference from noise points.…”
Section: Connector Imagesmentioning
confidence: 99%