2006
DOI: 10.1080/00224065.2006.11918624
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Design of Cumulative Sum Schemes for Start-Up Processes and Short Runs

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Cited by 23 publications
(19 citation statements)
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“…The value k = 0.25, however, gives a higher likelihood of detection within 30 observations. The effect of the design constants on detection performance is studied in detail by Zantek [11].…”
Section: The Run-length Distributionmentioning
confidence: 99%
“…The value k = 0.25, however, gives a higher likelihood of detection within 30 observations. The effect of the design constants on detection performance is studied in detail by Zantek [11].…”
Section: The Run-length Distributionmentioning
confidence: 99%
“…Due to the potential complexity present in MC environments, Statistical Process Control (SPC) procedures tend to require a considerable number of control charts to monitor quality characteristics and product specifications (Fan & You, 2009;Zantek, 2006). According to Gu et al (2013), this method is not appropriate, since the successive state of the manufacturing process cannot be reflected and out-of-control situations may not be observed.…”
Section: Introductionmentioning
confidence: 98%
“…The standard approach for monitoring quality control in this environment is to ignore the lag formed by the production of different products, in order not to restart the control chart for the same product (Fan & You, 2009;Zantek, 2006). The warm-up is not considered in this approach as well as common variability that could be estimated through the entire series (Gu, Jia, You, & Zhang, 2013).…”
Section: Introductionmentioning
confidence: 99%
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“…iii) using "self-starting" control charts (Hawkins [5], Quesenberry [17], Quesenberry [19], Sullivan and Jones [24], Zantek [26], Hawkins and Maboudou-Tchao [6]). …”
Section: Introductionmentioning
confidence: 99%