2016
DOI: 10.1109/jphotov.2015.2481598
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Design of CdZnTe and Crystalline Silicon Tandem Junction Solar Cells

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Cited by 17 publications
(7 citation statements)
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“…First, the core of the structure consists of two solar cells (CZTS solar cell and Si solar cell) with an intermediate connection. Second, the top and bottom electrodes which TCO-less tandem DSSC 7.1 [21] DSSC/CIGS 12.35 [22] DSSC/GaAs 7.63 [23] DSSC/c-Si 17.23 [24] DSSC/a-Si 18.1 [25] Perovskite/c-Si 23.6-26.4 [ 26,27] CZT/Si 16.8-34.1 [28] CZTS/Si 3.5-15 [ 5,29,30] Structures dimensions and materials properties are given in Table 2. As shown in Table 2, the studied structures are thin film solar cells.…”
Section: Device Simulationmentioning
confidence: 99%
“…First, the core of the structure consists of two solar cells (CZTS solar cell and Si solar cell) with an intermediate connection. Second, the top and bottom electrodes which TCO-less tandem DSSC 7.1 [21] DSSC/CIGS 12.35 [22] DSSC/GaAs 7.63 [23] DSSC/c-Si 17.23 [24] DSSC/a-Si 18.1 [25] Perovskite/c-Si 23.6-26.4 [ 26,27] CZT/Si 16.8-34.1 [28] CZTS/Si 3.5-15 [ 5,29,30] Structures dimensions and materials properties are given in Table 2. As shown in Table 2, the studied structures are thin film solar cells.…”
Section: Device Simulationmentioning
confidence: 99%
“…Blanker 1 reported a two terminal tandem configuration which utilizes copper indium gallium selenide (CIGS) thin film as top cell absorber and hydrogenated amorphous silicon absorber layers in bottom cell. The tandem structures designed with cadmium zinc telluride (CdZnTe) and cadmium telluride (CdTe) in combination with silicon as a bottom cell absorber were reported by 2,3 . An analytical model has been developed for kesterite‐based tandem solar cells in Reference 4.…”
Section: Introductionmentioning
confidence: 99%
“…Rapidly growing applications of CdZnTe as a material suitable for X-ray and γ-ray detector fabrication and for high-efficiency solar cells , have introduced the urgent need for characterization of photocarrier properties and their associated solid-state transport parameters, including their spatial distributions in wafer substrates, which affect charge transport and limit the performance of optoelectronic devices. Most popular diagnostic methods in use are current deep-level transient spectroscopy (I-DLTS), transient current technique (TCT), current and capacitance vs voltage ( I – V and C – V ) measurements, γ-ray spectroscopy, Hall measurements, and optical and thermal measurements. Beyond those methodologies, photocarrier radiometry (PCR) is a nondestructive and noncontacting spectrally gated frequency-domain dynamic semiconductor photoluminescence (PL) diagnostic modality, which allows for the simultaneous nondestructive determination of electronic transport parameters in semiconductor substrates and devices. Subsequently, lock-in carrierography (LIC) was introduced as a near-infrared (NIR) imaging extension of PCR, aimed at constructing quantitative images of carrier transport parameters. Next, two-beam heterodyne LIC (HeLIC) was introduced to address the need for high-frequency photocarrier excitation, eliciting fast enough signal responses required to measure short recombination lifetimes and other fast photocarrier relaxation processes.…”
Section: Introductionmentioning
confidence: 99%