2004
DOI: 10.1109/jmems.2004.832192
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Design of a Temperature-Stable RF MEM Capacitor

Abstract: This paper presents a novel temperature-compensated two-state microelectromechanical (MEM) capacitor. The principle to minimize temperature dependence is based on geometrical compensation and can be extended to other devices such as MEM varactors. The compensation structure eliminates the effect of intrinsic and thermal stress on device operation. This leads to a temperature-stable device without compromising the quality factor (Q) or the voltage behavior. The compensation structure increases the robustness of… Show more

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Cited by 39 publications
(11 citation statements)
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References 14 publications
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“…Particularly noticeable are varactor diodes [6], paraelectric capacitors [7], and micro electromechanical system (MEMS) capacitors [8]. A specific characteristics of a varactor diode is its depletion region capacitance which can be varied by the applied bias voltage [9].…”
Section: State Of the Artmentioning
confidence: 99%
“…Particularly noticeable are varactor diodes [6], paraelectric capacitors [7], and micro electromechanical system (MEMS) capacitors [8]. A specific characteristics of a varactor diode is its depletion region capacitance which can be varied by the applied bias voltage [9].…”
Section: State Of the Artmentioning
confidence: 99%
“…Some methods have been adopted to reduce the sensitivity to temperature, for example, using composite beam, optimising structure, and even employing new materials and so on. [3][4][5][6][7][8][9][10][11] All of these methods not only require advanced MEMS design efforts and special materials, but also have precise fabrication flow.…”
Section: Introductionmentioning
confidence: 99%
“…Literature clearly state that damage mechanisms are basically depending on the plastic behavior of material (Rebeiz 2002), static rupture (Tabata 2008), fatigue (Espinosa 2006) and thermal fatigue (Nieminen 2004, Goldsmith 2005, fracture and creep (Rezvanian 2008), wear and electric failures (Reid 2003). Nevertheless, operation of the RF-microswitch may lead evenly to a collapse due to buckling (Shamshirsaz 2008) or to a dynamic resonance (Brusa and Munteanu 2006a;Brusa 2006c).…”
Section: Introductionmentioning
confidence: 99%
“…Interaction between electromechanical actions and environmental fluid surrounding the MEMS was evenly analysed (Veijola et al 2009). Only recently research activities were focused on the temperature role in microswitch functionality and reliability (Hasiang Pan 2002;Nieminen et al 2004;Zhu and Espinosa 2004;Goldsmith 2005;Kang 2005;Rezvanian 2008;Bognar 2009;Yan 2009;Mahameed 2010;Saeedivahdat 2010;Zamanian 2010). Unfortunately, conclusions and remarks are still in contrast each other.…”
Section: Introductionmentioning
confidence: 99%