2014
DOI: 10.1063/1.4897147
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Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

Abstract: We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system… Show more

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Cited by 9 publications
(4 citation statements)
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References 33 publications
(40 reference statements)
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“…The annealed sample was imaged using a low-temperature atomic force/magnetic force microscope (LT-AFM/MFM) (NanoMagnetics Instruments Ltd., Oxford, UK) at 300 K in PPMS. 18 In Figure 2a, a topography image of the sample shows how NPs are distributed on the silicon surface. The average height of the NPs was approximately 5 nm, which is compatible with the TEM results.…”
Section: Resultsmentioning
confidence: 99%
“…The annealed sample was imaged using a low-temperature atomic force/magnetic force microscope (LT-AFM/MFM) (NanoMagnetics Instruments Ltd., Oxford, UK) at 300 K in PPMS. 18 In Figure 2a, a topography image of the sample shows how NPs are distributed on the silicon surface. The average height of the NPs was approximately 5 nm, which is compatible with the TEM results.…”
Section: Resultsmentioning
confidence: 99%
“…According to the preference of the experimentalist, signal generation can be based predominantly on two-beam interference of Michelson-type or multi-beam interference of Fabry–Pérot-type, the latter with either low or high finesse. While a Michelson-type interferometer is simple in adjustment and robust in operation [ 27 28 ], the high-finesse cavity of a Fabry–Pérot interferometer yields high optical signal amplification but requires a sophisticated cavity design or active stabilization [ 29 31 ].…”
Section: Discussionmentioning
confidence: 99%
“…The localization of the electrons as shown in Fig. 3 makes the graphitic nanocone a possible candidate for the construction of a new type of scanning probe in atomic force microscopy [12][13][14][15]. ACKNOWLEDGEMENTS -The work was supported by the Science and Technology Assistance Agency under Contract No.…”
Section: Discussionmentioning
confidence: 99%