2018
DOI: 10.1039/c8ra08216b
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Design of a multi-well plate for high-throughput characterization of heterogeneous catalysts by XRD, FT-IR, Raman and XRF spectroscopies

Abstract: This paper presents a methodology to design a versatile, unique multi-well plate for high-throughput characterisation of heterogeneous catalyst by 4 different techniques (IR, Raman, XRF and XRD).

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Cited by 7 publications
(3 citation statements)
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References 15 publications
(19 reference statements)
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“…Solid-phase Raman spectroscopy is merely a surface technique as its penetration depth is less than 1 μm, whereas the depth for XRD reaches up to 1 mm. 41,42 In this study, the 514 nm laser used in the Raman analyses has a penetration depth of approximately 800 nm in Si, 43 and accordingly, the Raman data could not contain the information on entire crystallites.…”
Section: Effect Of Liquid Metal Catalyst On the Crystallinitymentioning
confidence: 97%
“…Solid-phase Raman spectroscopy is merely a surface technique as its penetration depth is less than 1 μm, whereas the depth for XRD reaches up to 1 mm. 41,42 In this study, the 514 nm laser used in the Raman analyses has a penetration depth of approximately 800 nm in Si, 43 and accordingly, the Raman data could not contain the information on entire crystallites.…”
Section: Effect Of Liquid Metal Catalyst On the Crystallinitymentioning
confidence: 97%
“…This can be done either in fast sequence or in parallel, with characterization techniques that are available in high-throughput configuration, such as X-ray Diffraction (XRD), Raman spectroscopy, Fourier Transform Infrared, and X-ray Fluorescence. 58 HTE platforms can be designed in such a way that they integrate synthesis, characterization, and performance evaluation, including chemical, biological, and hybrid catalysis; 12,59 and homogeneous and heterogeneous catalysis. 60 Furthermore, HTE can be combined with in silico screening techniques, in such ways that the material space is first explored in silico and the most promising candidates are synthesized in HTE facilities.…”
Section: ■ Introductionmentioning
confidence: 99%
“… High-Throughput Screening: Fast testing of desired functions or properties of materials. This can be done either in fast sequence or in parallel, with characterization techniques that are available in high-throughput configuration, such as X-ray Diffraction (XRD), Raman spectroscopy, Fourier Transform Infrared, and X-ray Fluorescence …”
Section: Introductionmentioning
confidence: 99%