2015
DOI: 10.1016/j.microrel.2014.12.019
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Design of a folded cascode opamp with increased immunity to conducted electromagnetic interference in 0.18μm CMOS

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Cited by 21 publications
(14 citation statements)
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“…However, a straightforward use of an RC filter is impractical because it deteriorates the phase margin and, therefore, the stability of the amplifier. A better solution is based on the RC filter connected to a replica input stage, as suggested in [19,25]; the latter topology is shown in Figure 8. Another topology, robust to EMI, is the source buffered folded cascode, which is based on a input differential pair similar to that of the SB Miller amplifier.…”
Section: Compared Topologies and Their Ac Characteristicsmentioning
confidence: 99%
“…However, a straightforward use of an RC filter is impractical because it deteriorates the phase margin and, therefore, the stability of the amplifier. A better solution is based on the RC filter connected to a replica input stage, as suggested in [19,25]; the latter topology is shown in Figure 8. Another topology, robust to EMI, is the source buffered folded cascode, which is based on a input differential pair similar to that of the SB Miller amplifier.…”
Section: Compared Topologies and Their Ac Characteristicsmentioning
confidence: 99%
“…At middle-large frequencies, all the amplifiers exhibit a larger susceptibility to the interference and the EMI-induced offset is around 300-400 mV for a wide frequency range. In conclusion, classic CMOS amplifiers exhibit a nonnegligible dc shift induced by the interfering signals: this offset is dependent on the amplitude of the interference and increases with the EMI frequency [8], [9].…”
Section: B Emi Susceptibility Of a Digitally Based Amplifiermentioning
confidence: 90%
“…Numerous techniques have thus emerged to increase the immunity of circuits against electromagnetic disturbances, as shown in [4,5], to name a few. In this context, one recent model has been developed to simulate the immunity of integrated circuits: ICIM (integrated circuit immunity modelling), which has been proposed to the IEC standard [6] and since used in several studies [7,8].…”
Section: Contextmentioning
confidence: 99%