2003
DOI: 10.1016/s0168-583x(03)01007-3
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Design of a focusing high-energy heavy ion microbeam system at the JAERI AVF cyclotron

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Cited by 29 publications
(10 citation statements)
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“…The focusing heavy-ion microbeam system generates a beam spot using a magnetic lens. The details of the beam optics have already reported elsewhere [43][44][45] and it is therefore only described in brief. The heavy-ion beam from the AVF cyclotron was introduced into the HX1 vertical beam line with a ninety degrees bending magnet.…”
Section: System Outlinementioning
confidence: 99%
“…The focusing heavy-ion microbeam system generates a beam spot using a magnetic lens. The details of the beam optics have already reported elsewhere [43][44][45] and it is therefore only described in brief. The heavy-ion beam from the AVF cyclotron was introduced into the HX1 vertical beam line with a ninety degrees bending magnet.…”
Section: System Outlinementioning
confidence: 99%
“…The energy of the accelerated ions, modulated with the electric field, is the implantation energy and its values are in the range from electron volts to mega-electron volts. The * corresponding author; e-mail: Saharrezaee593@iauksh.ac.ir target material properties are changed according to the nature, quantity, and energy of the ions providing various applications [1][2][3][4][5].…”
Section: Introductionmentioning
confidence: 99%
“…There are two configurations: microbeams and broad beams. On the one hand, micro/nano-beams allow the irradiation of a selected cell, or a portion of a cell, with a precise number of ions [9][10][11][12][13][14][15][16]. However, microbeam installation requires tedious developments for cell recognition, alignment and beam scanning.…”
Section: Introductionmentioning
confidence: 99%