2011
DOI: 10.1587/transfun.e94.a.352
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Design Methodology for Yield Enhancement of Switched-Capacitor Analog Integrated Circuits

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Cited by 3 publications
(8 citation statements)
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“…However, in many applications, multiple capacitors are taking into account to the placement. Considering that the capacitor set CS={C 0 , C 1 , ..., C } contains N group of capacitors, the overall correlation coefficient L [12,13] is defined as follows.…”
Section: Random Mismatch -Spatial Correlation Modelmentioning
confidence: 99%
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“…However, in many applications, multiple capacitors are taking into account to the placement. Considering that the capacitor set CS={C 0 , C 1 , ..., C } contains N group of capacitors, the overall correlation coefficient L [12,13] is defined as follows.…”
Section: Random Mismatch -Spatial Correlation Modelmentioning
confidence: 99%
“…The placements are used to evaluate the ratio mismatch M and overall correlation coefficient L simultaneously [13][14][15][16]. In fact, the success of resulting in better ratio mismatch was attributed to place both C0 and C1 at the central entries of the array [22].…”
Section: Performance Metrics Of Uc Placementmentioning
confidence: 99%
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