Design for testability strategies for mixed signal &amp; analogue designs-from layout to system

Richardson, A.; Lechner, A.; Olbrich, T.

doi:10.1109/icecs.1998.814914

Cited by 8 publications

(6 citation statements)

References 18 publications

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“…This process is called the design for testability (DfT) [1]- [3]. The process of test point selection limits an access to the CUT and can be classified into DfT domain.…”

Section: Introductionmentioning

confidence: 99%

Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection

Golonek

Rutkowski

2007

IEEE Trans. Circuits Syst. II

109

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A new approach to an optimal analog test points selection is proposed. The described method uses ambiguity set concept and evolutionary computations to determine the optimal set of analog test points. After a brief introduction to analog testing and genetic algorithms, the proposed strategy is explained. The presented evolutionary approach is illustrated by a practical example of analog circuit and by a series of hypothetical circuits. The efficiency of the technique is compared with a method based on entropy index, and the obtained results are discussed.Index Terms-Analog circuits, analog system testing, design for testability (DfT), genetic algorithms (GAs).

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“…This process is called the design for testability (DfT) [1]- [3]. The process of test point selection limits an access to the CUT and can be classified into DfT domain.…”

Section: Introductionmentioning

confidence: 99%

Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection

Golonek

Rutkowski

2007

IEEE Trans. Circuits Syst. II

109

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“…This will be particularly important for designers of mixed signal intellectual property and cell libraries for use in systems-on-silicon, as the trend is for more efficient and higher quality macro test [9].…”

Section: Discussionmentioning

confidence: 99%

“…An overview of defect oriented testing and DfT optimisation of mixed signal ICs is presented in [5,8,9,10]. Several DfT studies have been published, including work on a current mode DAC where test vectors are optimised and redundancies removed [11], on analogue filters where the controllability and observability is improved to test a number of stages separately [12,13,14] and on flash ADC [15,16].…”

Section: State-of-the-art In Analogue and Mixedsignal Design For Testmentioning

confidence: 99%

A digital partial built-in self-test structure for a high performance automatic gain control circuit

Lechner

Ferguson

Richardson

et al. 1999

Proceedings of the Conference on Design, Automation and Test in Europe

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“…The tool of graphical representation of test for automated generation of test programs for analog and mixed-signal IC compatible with EDIF netlists is given in [4]. A number of possible DFT approaches that may help to solve test cost and test quality difficulties for analogue and MSIC is described in [5]. The solutions described above simplify the program development for testing MSIC, but not consider a realizing the diagnosis of individual functional blocks and unified application of automated test equipment.…”

Section: Introductionmentioning

confidence: 99%

Test program generation for mixed-signal integrated circuits based on automata network

Mosin

2015

2015 IEEE East-West Design &Amp; Test Symposium (EWDTS)

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Testing and diagnosis of mixed-signal integrated circuits are very important and complex tasks, which require selection the most relevant test methods for analog and digital subcircuits and subsequent their matching for comprehensive testing of a circuit on the whole. Two basic models for description the test process of mixed-signal IC based on the algebraic automata theory are proposed. The method of test program generation for mixed-signal IC in the form of automata network is presented in the paper. Generated test programs take into account the features of CUT and used test equipment and also ensure matching of applied test methods for hierarchical testing of mixed-signal IC. The method provides the feasibility to the automated test program generation for mixed-signal IC testing with various resolving ability using the state-of-the-art ATE. Experimental results of the method application for the mixed-signal circuit are presented.

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Design for testability strategies for mixed signal & analogue designs-from layout to system

Cited by 8 publications

References 18 publications

Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection

Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection

A digital partial built-in self-test structure for a high performance automatic gain control circuit

Test program generation for mixed-signal integrated circuits based on automata network

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