Design and Validation of Transverse Electromagnetic (TEM) Cell for Measurement of Pulsed Transients

Satyaprasad, K.; Kumar, Pankaj; Rani, N. Deepika

doi:10.1007/978-981-13-1906-8_70

Lecture Notes in Electrical Engineering

2018

DOI: 10.1007/978-981-13-1906-8_70

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Design and Validation of Transverse Electromagnetic (TEM) Cell for Measurement of Pulsed Transients

K. Satyaprasad¹,

Pankaj Kumar

N. Deepika Rani³

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2020

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“…In literature, there are several works reporting information on the EM field distribution inside TEM cells [11]- [21]. However, in addition to the above-mentioned questions (Q1 to Q5), (Q6) the question of E-and particularly H-field distributions as a function of frequency has not been addressed so far in TEM cells analysis, especially in presence or absence of different materials.…”

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Perturbations of Electric and Magnetic Fields Due to the Presence of Materials in TEM Cells

Koohestani

Ramdani

Besnier

et al. 2020

IEEE Trans. Electromagn. Compat.

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This paper investigates in detail the impact of electric (E) and magnetic (H) field distributions inside TEM cells, below and above the corresponding dominant modes of the cells, in conditions differing from free space, i.e. in presence of representative ferromagnetic and dielectric materials. Simulations and measurements were performed from hundreds of MHz to GHz using IEC 61967-2 (closed) and open TEM cells. Whatever the frequency and EUT location, unlike dielectric material which only locally changes the norms (.) of E (and H depending on permittivity) at its location, the presence of ferromagnetic material inside the cell changes both E and H distributions: locally below the dominant mode frequency and globally at the entire bottom of the cell above that frequency. This demonstrates that a local distortion of H-field, due to ferromagnetic material, has a stronger influence than a local distortion of Efield, disregarding frequency, location and magnetic losses. Moreover, the demand to use a TEM cell below the dominant mode frequency, as mentioned in the IEC 61967-2 and 62132-2 standards, may not be relevant, provided that both EM field inhomogeneities are considered, and the presence of an IC package in the cell is accounted for in the equivalent E-field level around the pins in immunity testing. Keywords-closed and open TEM cells, E and H field distribution, ferromagnetic and dielectric materials I. INTRODUCTION E LECTROMAGNETIC IMMUNITY (EMI) and electromagnetic compatibility (EMC) characterization of integrated circuits (ICs) are of great importance as the high-speed signals not only cause signal integrity issues, but also lead to radiation and interference problems [1]-[3]. Particularly, with the fast pace of ICs technologies to reduce their sizes and/or

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mentioning

confidence: 99%

Perturbations of Electric and Magnetic Fields Due to the Presence of Materials in TEM Cells

Koohestani

Ramdani

Besnier

et al. 2020

IEEE Trans. Electromagn. Compat.

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Design and Validation of Transverse Electromagnetic (TEM) Cell for Measurement of Pulsed Transients

Cited by 1 publication

References 3 publications

Perturbations of Electric and Magnetic Fields Due to the Presence of Materials in TEM Cells

Perturbations of Electric and Magnetic Fields Due to the Presence of Materials in TEM Cells

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