Design and Operation of an Electron Diffraction Camera for the Study of Small Crystalline Regions

Cockayne, D. J. H.; Goodman, P.; Mills, J. C.; Moodie, A. F.

doi:10.1063/1.1720975

Cited by 30 publications

(10 citation statements)

References 15 publications

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“…8, Column 5, is shown the effect, on a series of calculated images, of summing images from scattering calculations for 11 angles of incidence across the cone of convergence. The summation consisted of addition of intensities, and not phases and amplitudes, since the source can be regarded as incoherent and, in this respect, is exactly similar to diffraction in a convergent-beam diffraction camera (Cockayne, Goodman, Mills & Moodie, 1967). As can be seen, the effect of divergence is zero at zero defect &focus and is increased as the absolute value of defect of focus increases.…”

Section: Results From Image Calculationsmentioning

confidence: 91%

n-Beam lattice images. II. Methods of calculation

Lynch¹,

O’Keefe²

1972

Acta Cryst Sect A

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The calculation of amplitudes and phases of beams of electrons diffracted from thin (_ 100 rim) crystals of W4Nb26Ov7 is described. These diffraction data are used to compute 11-beam 00l electron microscope lattice images and the effects of instrument aberrations are considered. Several approximations are compared with a more exact 435-beam, two-dimensional computation, and with experimental diffraction data and lattice images. Finally, the projected charge density approximation to image contrast is evaluated.

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Section: Results From Image Calculationsmentioning

confidence: 91%

n-Beam lattice images. II. Methods of calculation

Lynch¹,

O’Keefe²

1972

Acta Cryst Sect A

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“…It is similar to a camera described by Mills et al [18]. Kossel-Möllenstedt patterns can be taken from very small specimen areas of the order of 100 Ä in diameter.…”

Section: Methodsmentioning

confidence: 99%

Axial Channeling in Electron Diffraction

Ichimiya

Lehmpfuhl

1978

Zeitschrift Für Naturforschung A

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Kossei patterns from Silicon and Niobium were obtained with a convergent electron beam. An intensity maximum in the direction of the zone axes [001] and [111] of Nb was interpreted as axial channeling. The intensity distribution in Kossel patterns was calculated by means of the Bloch wave picture of the dynamical theory of electron diffraction. Particularly zone axis patterns were calculated for different substance-energy combinations and they were compared with experimental observations. The intensity distribution in the calculated Kossel patterns was very sensitive to the model of absorption and it was found that a treatment of the absorption close to the model of Humphreys and Hirsch [Phil. Mag. 18, 115 (1968)] gave the best agreement with the experimental observations. Furthermore it is shown which Bloch waves are important for the intensity distribution in the Kossel patterns, how they are absorbed and how they change with energy.

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“…Ackermann 22 preferred to plot sf versus nf and then determine thickness from the slope of the graph. Goodman and Lehmpfuhl 23 and Cockayne et al 24 reported the use of convergent beams in diffraction cameras for determining thicknesses to within one or two atomic layers by matching the fringe structure in the diffraction spot with theoretical predictions.…”

Section: Electron Diffraction Techniquesmentioning

confidence: 99%

Foil thickness measurements in transmission electron microscope

Scott¹,

Love²

1987

Materials Science and Technology

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Methods for the in situ measurement of foil thickness in the transmission electron microscope (TEM) are reviewed for the non-specialist. The techniques described range from those based upon the analysis of crystallographic features contained in the specimen, as may be carried out with the most basic TEM configuration, to those which involve measurements of electron energy loss spectra or X-ray emission characteristics and require the addition of sophisticated analytical equipment to the electron microscope. Some methods are seen to give the foil thickness directly, while others must be regarded as being relative since they require calibration using reference foils of known thickness and composition. Factors such as the range of applicability, ease of use, and accuracy of the techniques are discussed as well as the possibility of misinterpreting the data.MSTj665

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Design and Operation of an Electron Diffraction Camera for the Study of Small Crystalline Regions

Cited by 30 publications

References 15 publications

n-Beam lattice images. II. Methods of calculation

n-Beam lattice images. II. Methods of calculation

Axial Channeling in Electron Diffraction

Foil thickness measurements in transmission electron microscope

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