Abstract:As manufacturing efficiency has become a main focus of today's business, it is very critical to surge the throughput by developing different test strategies. With throughput, testing cost also has been recognized as the major challenge in the future of leading semiconductors. Reducing test time is a significant effort to maximize throughput as the complexity increases in future generation outcomes and devices. So, low-cost Automatic Test Equipment (ATE) with parallel test can be promoted as the obvious solutio… Show more
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