This paper presents the design, implementation methodology, and validation of a multi-bit flip-flop system that provides tolerance against Single Event Upsets (SEU) and Single Event Transients (SET) caused by radiation strikes. The proposed solution also has embedded timing pre-error sensing capability, which enables closed-loop integration of digital systems to work at optimal operating point (OPP) without any fail. It allows efficient real-time Dynamic Voltage Frequency Scaling (DVFS) implementation in the digital system. It helps detect aging-related and Total Ionizing Dose (TID) induced timing degradation in digital circuits. It can be implemented with any standard digital cell library (non-rad-hard), thereby providing a cost-effective solution for rad-hard applications. The design is implemented in ST BCD 90 nm technology in multiple configurations of bit sizes. A digital system based on ARM cortex M4 microprocessor has also been implemented with the proposed Flip-Flop (FF) and put on silicon for testing to validate various capabilities of the proposed design. The results are presented based on simulations, electrical characterization, and radiation tests.