Design and crystallography of multilayered media

Laughlin, David E.; Feng, Yanhuan; Lambeth, D.N.; Lee, Li-Lien; Tang, Li

doi:10.1016/0304-8853(95)00717-2

Cited by 14 publications

(3 citation statements)

References 13 publications

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“…Chromium thin films are routinely used for a number of applications, in integrated circuits, photomasks, and optical beam splitters and as underlayers in multilayered magnetic media for high-density magnetorecording . The Cr film, in the last case, acts as a structural template for inducing the epitaxial growth of the magnetic Co-based film. , A crucial step to improving the magnetic and recording characteristics of multilayer media is the understanding of the inter-relationship between the deposition processes and the resulting microstructural properties of the film. In hard disk fabrication sputtering deposition is the most commonly used technique.…”

Section: Introductionmentioning

confidence: 99%

“…1 The Cr film, in the last case, acts as a structural template for inducing the epitaxial growth of the magnetic Co-based film. 2,3 A crucial step to improving the magnetic and recording characteristics of multilayer media is the understanding of the inter-relationship between the deposition processes and the resulting microstructural properties of the film. In hard disk fabrication sputtering 4 deposition is the most commonly used technique.…”

Section: Introductionmentioning

confidence: 99%

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Structural and Morphological Characterization by Energy Dispersive X-ray Diffractometry and Reflectometry Measurements of Cr/Pt Bilayer Films

et al. 2003

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The characteristics of Cr thin films, currently used as resistors, as capacitor plates, and in magnetic recording hard disks, strongly depend on the deposition modality. Nevertheless, up to date no systematic study of the influence of the deposition conditions and of the substrate used on the films structural and morphological properties has been carried out.In the present work, the energy dispersive X-ray diffraction and reflectometry (EDXD and EDXR) techniques were used to investigate double-layer Cr/Pt thin films, deposited by pulsed laser deposition (PLD) at different temperatures (from RT to 600 °C) both on crystalline (Si and MgO) and on amorphous (SiO 2 ) substrates. The synergy of the two X-ray techniques allows correlating the structural properties of the samples (obtained by the EDXD) to their morphological characteristics (provided by EDXR). The result is that when the PLD deposition is performed under suitable working conditions and with use of crystalline substrates, films with good texture and with very smooth surfaces were obtained, as required by the magnetorecording applications. Moreover, the structural quality appears to be independent of the deposition temperature. Finally, the advantages connected with the joint use of the energy-dispersive X-ray diffraction and reflectometry are shortly discussed.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Structural and Morphological Characterization by Energy Dispersive X-ray Diffractometry and Reflectometry Measurements of Cr/Pt Bilayer Films

et al. 2003

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“…Moreover the stringent magnetic requirements on media noise for the advanced high density longitudinal media for the next decade will be met by the use of quaternary and five-element alloys in either single layer or laminated configurations. Recently various schemes for the design of multilayered media have been discussed [8] and for tailoring all the properties such as texture, anisotropy, in-plane H c and noise performance one can come to an optimised structure which consists of about 9 different layers including the lubricant, overcoat and overlayers. Although PMR is not commercially available today may be it could be a reasonable alternative for the future super density recording system.…”

Section: Magnetic Recording Modes: Lmr Ts Pmrmentioning

confidence: 99%

Magnetic structures in CoCr media for perpendicular magnetic recording

Lodder

1996

Journal of Magnetism and Magnetic Materials

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High bit densities have been demonstrated in longitudinal as well as in perpendicular magnetic recording. For the latter an area density of more than 12 Gbit/in 2 has been obtained in a sputtered Co-Cr-Ta hard disk with a soft magnetic underlayer recorded with a special single pole head. In this paper the role of microstructure and morphology in relation to the compositional separation is discussed. Very sensitive anomalous Hall measurements have been performed from submicron Co-Cr samples to obtain more detail information about the reversal characteristics of the material. The results obtained have been used in our model for micromagnetic simulations. One of the conclusions is that most of the magnetic entities reversing their magnetisations are much smaller than the volume of one Co-Cr column.

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Ferromagnetic Sputtering Targets and Thin Films for Silicides and Data Storage

Sarkar¹

2014

Sputtering Materials for VLSI and Thin Film Devices

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Design and crystallography of multilayered media

Cited by 14 publications

References 13 publications

Structural and Morphological Characterization by Energy Dispersive X-ray Diffractometry and Reflectometry Measurements of Cr/Pt Bilayer Films

Structural and Morphological Characterization by Energy Dispersive X-ray Diffractometry and Reflectometry Measurements of Cr/Pt Bilayer Films

Magnetic structures in CoCr media for perpendicular magnetic recording

Ferromagnetic Sputtering Targets and Thin Films for Silicides and Data Storage

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