2008 IEEE Sensors 2008
DOI: 10.1109/icsens.2008.4716738
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Design and characterization of in-plane silicon stress sensors with isotropic sensitivity

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Cited by 14 publications
(3 citation statements)
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“…Adapted with permission. [ 46 ] Copyright 2010, IEEE. c) Vector light sensors: i) Perspective view, ii) cross‐sectional view, and iii) SEM image of the vector light sensors with an inverted pyramid structure; iv) calibration curve of the vector light sensors.…”
Section: Bulk Chemical Etchingmentioning
confidence: 99%
See 1 more Smart Citation
“…Adapted with permission. [ 46 ] Copyright 2010, IEEE. c) Vector light sensors: i) Perspective view, ii) cross‐sectional view, and iii) SEM image of the vector light sensors with an inverted pyramid structure; iv) calibration curve of the vector light sensors.…”
Section: Bulk Chemical Etchingmentioning
confidence: 99%
“…As shown in Figure 3b(i), a coordinate sensor or coordinate measurement machine (CMM) with a “stylus‐on‐boss” structure consists of a hinged membrane (boss), probing pin, and probing sphere (stylus), and 32 piezoresistive field effect transistor (piezo‐FET) stress sensors. [ 46 ] The boss membrane is anisotropically etched by DRIE to achieve eight symmetrical cuboid hinges where four pieo‐FET stress sensors are integrated. A through‐hole is also etched in the center of the membrane to socket the stylus, comprising an aluminum (Al) pin and a ruby sphere.…”
Section: Bulk Chemical Etchingmentioning
confidence: 99%
“…In order to exert in-plane shear stress ay on the same silicon strips, a novel TB was used [11]. The setup consists of two clamps precisely aligned on a rotational axis.…”
Section: Theory and Operation Modementioning
confidence: 99%