Design and characterization for travelling wave electrodes of high‐speed <scp>M</scp>ach‐<scp>Z</scp>ehnder electro‐optic modulator on an n‐doped <scp>I</scp>n<scp>P</scp> substrate

Kim, Sung-Il; Lee, Chul-Uk; Song, Minhyup; Kwak, Min Hwan

doi:10.1002/mop.31203

Cited by 6 publications

(3 citation statements)

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“…The effect of a particular layer j on light propagation is taken into account by calculating the optical fill factor Γ opt, j . For an arbitrary layer, Γ opt, j can be expressed as (11).…”

Section: Waveguide Optical Fill Factormentioning

confidence: 99%

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Multi-Parameter Optimization of an InP Electro-Optic Modulator

et al. 2020

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In this article, a method for indium phosphide (InP) electro-optic modulator (EOM) optimization is introduced. The method can be used for the design and analysis of an EOM based on the Mach-Zehnder interferometer (MZI) design. This design is based on the division of the input optical signal into two optical paths and then, after processing, it combines the light into a single waveguide. The symmetry of the structure can provide state-of-the-art EOM characteristics with a push-pull control signal. Using a traveling wave electrode (TWE) design as a starting point, the authors varied the heterostructure design and optical waveguide parameters to obtain the optimal values of initial optical loss, evenness of the initial optical loss in the operating wavelength range, and the extinction ratio and length of the modulator arm. The key features of the proposed optimization method include the following: all independent input parameters are linked into a single system, where the relationship between the electrical and optical parameters of the modulator is realized; all physically realizable combinations of the input parameters are available for analysis; and EOM optimization is possible for one target parameter or for a group of target parameters. The results of the EOM optimization using the described method are presented.

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Section: Waveguide Optical Fill Factormentioning

confidence: 99%

“…For the intensity control, a Mach-Zehnder interferometer (MZI) design [10] is used. Furthermore, EOMs use the push-pull principle [11] and have symmetrical electrodes and optical arm topology.…”

Section: Introductionmentioning

confidence: 99%

Multi-Parameter Optimization of an InP Electro-Optic Modulator

et al. 2020

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“…However, few scholars have studied the microwave characteristics of photosensitive materials under light irradiation. Since many microwave circuit devices are implemented based on photosensitive semiconductor materials [24][25][26], when the microwave performance of the material changes, the performance of these devices may change, and even lead to the failure of the devices to work properly. Therefore, it is necessary to study the microwave characteristics of photosensitive materials under light irradiation in microwave photonics.…”

Section: Introductionmentioning

confidence: 99%

Microwave Characteristics Analysis of Typical Photosensitive Material InP Under Weak Light Irradiation Based on Quasi-Optical Resonator

Gao

et al. 2020

Electron. Mater. Lett.

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In this paper, the microwave characteristics of typical photosensitive material InP under different light irradiation are studied. The measurement sensor is a reflection-type hemispherical quasi-optical resonator with an operating frequency range from 20 to 40 GHz, an operating mode of TEM 00q , and a quality factor of 18,000 or more. For the short-time irradiation experiment, the variation of InP microwave characteristics with the irradiation power of 20 mW, 60 mW, 100 mW, and 200 mW, is studied by frequency-domain and time-domain scanning methods, respectively. The measurement results indicate that the microwave characteristics of InP change significantly even under weak light irradiation. Taking 100 mW and 200 mW irradiation power as examples, the long-time irradiation experiment performed on InP lasting 1.5 min is carried out. The measurement result curves clearly show the influence of the thermal and non-thermal effects on the InP microwave characteristics at the instant of the monochrome light source opening and closing and during irradiation. Furthermore, the temperature distribution of InP during 200 mW irradiation is real-time imaged by a thermal infrared imager to verify the existence of thermal effect during irradiation. The measurement results are in good agreement with the theoretical analysis.

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