Design and Calculations for the New ECRIS at KVI

Kremers, H. R.; Beijers, Johannes; Brandenburg, S.; Formanoy, I.; Mulder, J.A.; Sijbring, J.; Koivisto, H.; Rantilla, K.

doi:10.1063/1.1893392

Cited by 3 publications

(2 citation statements)

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“…This opens the possibility to extract coupled phase space information and to diagnose fast transient effects in the plasma. For this reason, scintillator based as well as multichannel plate pepperpot scanners are being developed in many ECR ion source groups [7][8][9].…”

Section: Ion Beam Emittance Diagnosticsmentioning

confidence: 99%

Ion beam properties for ECR ion source injector systems

Leitner¹,

Winklehner²,

Strohmeier³

2011

J. Inst.

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Electron Cyclotron Resonance (ECR) ion sources are essential components of heavyion accelerators due to their ability to produce the wide range of ions required by these facilities. The ever-increasing intensity demands have led to remarkable performance improvements of ECR injector systems mainly due to advances in magnet technology as well as an improved understanding of the ECR ion source plasma physics. At the same time, enhanced diagnostics and simulation capabilities have improved the understanding of the injector beam transport properties. However, the initial ion beam distribution at the extraction aperture is still a subject of research. Due to the magnetic confinement necessary to sustain the ECR plasma, the ion density distribution across the extraction aperture is inhomogeneous and charge state dependent. In addition, the ion beam is extracted from a region of high axial magnetic field, which adds a rotational component to the beam, which leads to emittance growth. This paper will focus on the beam properties of ions extracted from ECR ion sources and diagnostics efforts at LBNL to develop a consistent modeling tool for the design of an optimized beam transport system for ECR ion sources. KEYWORDS: Scintillators, scintillation and light emission processes (solid, gas and liquid scintillators); Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS)); Simulation methods and programs; Beam-line instrumentation (beam position and profile monitors; beam-intensity monitors; bunch length monitors)

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Section: Ion Beam Emittance Diagnosticsmentioning

confidence: 99%

Ion beam properties for ECR ion source injector systems

Leitner¹,

Winklehner²,

Strohmeier³

2011

J. Inst.

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“…The IPHC's emittance meter of Allison type is benchmarked with the pepperpot system of Pantechnik to complement previous investigations [19]. Measurement of the transverse emittance is carried out in the vertical plane with different beam cuts allowing a variation of the emittance (plane defined as 𝑦𝑦 for the Allison type emittance and 𝑥𝑥 for the pepperpot system).…”

Section: Jinst 18 P01011 4 Benchmarkingmentioning

confidence: 99%

Transverse emittance measurement in 2D and 4D performed on a Low Energy Beam Transport line: benchmarking and data analysis

et al. 2023

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2D and 4D transverse phase-space of a low-energy ion-beam is measured with two of the most common emittance scanners. The article covers the description of the installation, the setup, the settings, the experiment and the benchmark of the two emittance meters. We compare the results from three series of measurements and present the advantages and drawbacks of the two systems. Coupling between phase-space planes, correlations and mitigation of deleterious effects are discussed. The influence of background noise and aberrations of trace-space figures on emittance measurements and RMS calculations is highlighted, especially for low density beams and halos. A new data analysis method using noise reduction, filtering, and reconstruction of the emittance figure is described. Finally, some basic concepts of phase-space theory and application to beam transport are recalled.

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Optimization of a charge-state analyzer for electron cyclotron resonance ion source beams

Saminathan

Beijers

Kremers

et al. 2012

Review of Scientific Instruments

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A detailed experimental and simulation study of the extraction of a 24 keV He + beam from an ECR ion source and the subsequent beam transport through an analyzing magnet is presented. We find that such a slow ion beam is very sensitive to space-charge forces, but also that the neutralization of the beam's space charge by secondary electrons is virtually complete for beam currents up to at least 0.5 mA. The beam emittance directly behind the extraction system is 65 π mm mrad and is determined by the fact that the ion beam is extracted in the strong magnetic fringe field of the ion source. The relatively large emittance of the beam and its non-paraxiality lead, in combination with a relatively small magnet gap, to significant beam losses and a five-fold increase of the effective beam emittance during its transport through the analyzing magnet. The calculated beam profile and phase-space distributions in the image plane of the analyzing magnet agree well with measurements.The kinematic and magnet aberrations have been studied using the calculated second-order transfer map of the analyzing magnet, with which we can reproduce the phase-space distributions of the ion beam behind the analyzing magnet. Using the transfer map and trajectory calculations we have worked out an aberration compensation scheme based on the addition of compensating hexapole components to the main dipole field by modifying the shape of the poles. The simulations predict that by compensating the kinematic and geometric aberrations in this way and enlarging the pole gap the overall beam transport efficiency can be increased from 16 to 45%.

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Design and Calculations for the New ECRIS at KVI

Cited by 3 publications

References 0 publications

Ion beam properties for ECR ion source injector systems

Ion beam properties for ECR ion source injector systems

Transverse emittance measurement in 2D and 4D performed on a Low Energy Beam Transport line: benchmarking and data analysis

Optimization of a charge-state analyzer for electron cyclotron resonance ion source beams

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