2023
DOI: 10.1007/s00542-023-05459-0
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Design and analysis of a novel low RF MEMS switch with low pull-in voltage and high capacitance ratio

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Cited by 2 publications
(1 citation statement)
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“…Furthermore, the continuous improvement of contact materials and manufacturing processes is necessary to overcome challenges associated with contact resistance. Researchers and engineers are actively working to develop innovative solutions and materials to achieve low-contact resistance and improve the overall performance of MEMS ohmic contact switches [74,75]. Addressing these challenges is essential for advancing the reliability and efficiency of these switches in various applications.…”
Section: Contact Resistancementioning
confidence: 99%
“…Furthermore, the continuous improvement of contact materials and manufacturing processes is necessary to overcome challenges associated with contact resistance. Researchers and engineers are actively working to develop innovative solutions and materials to achieve low-contact resistance and improve the overall performance of MEMS ohmic contact switches [74,75]. Addressing these challenges is essential for advancing the reliability and efficiency of these switches in various applications.…”
Section: Contact Resistancementioning
confidence: 99%