Design & Evaluation Methodology For Built-In-Test

Abstract

This paper provides guidelines and procedures to optimize the ABIT BIT failure rate design of built-in-test (BIT) during the conceptual phase of system design. M maintenance man-hours per flight hour Optimization of the BIT design is achieved by properly specifying three Ma mean administrative delay time key design parameters: BIT effectiveness, mean corrective maintenance M ii mean corrective maintenance time time, and BIT reliability. These parameters together with the BIT design-MDt mean operational downtime per maintenance acto-cost target form the baseline criteria for designing the BIT equipment To n during subsequent phases. The paper provides straightforward tion mathematical tools, sensitivity analyses, and tradeoff procedures. MDT" mean operational downtime per malfunction M 1 mean logistics delay time

A study of function-based diagnosis strategy and testability analysis for a system

“…The possible problems in DFT are the increase of design complexity due to the electronic devices enclosed within it. Focusing on DFT, Lord and Gleason [6] provided DFT-related guidelines and procedures for optimizing the design of BIT during the conceptual phase of system design. Rhine [7] utilized a systematic approach to DFT.…”