Description d'un tube électronique puissant

Cauchois, Y.

doi:10.1051/jphysrad:01932003011051200

Cited by 12 publications

(11 citation statements)

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“…As Cauchois first pointed out in 1932, 5 if this angle is small (θ ≈ α), then the spectral line broadening associated with the cylindrical bending of the crystal and the source size is small and can be made comparable to the crystal's rocking curve width (or integrated reflectivity). In addition, the broadening associated with the crystal thickness decreases in proportion to the thickness.…”

Section: Introductionmentioning

confidence: 94%

High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy range

Seely¹,

Hudson

Henins

et al. 2016

Review of Scientific Instruments

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A Cauchois transmission-crystal spectrometer has been developed with high crystal resolving power in the 6 keV–15 keV energy range and sufficient sensitivity to record single-shot spectra from the Lawrence Livermore National Laboratory (LLNL) Titan laser and other comparable or more energetic lasers. The spectrometer capabilities were tested by recording the W L transitions from a laboratory source and the extended x-ray absorption fine structure (EXAFS) spectrum through a Cu foil.

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Section: Introductionmentioning

confidence: 94%

High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy range

Seely¹,

Hudson

Henins

et al. 2016

Review of Scientific Instruments

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“…Using such a set-up, the photons, scattered by the sample S at an angle .F of between 125 and 145 °, are energy analyzed and focused by a Cauchois curved crystal A (Cauchois, 1932) on a position-sensitive detector (image plate or gas detector). At high energies, the system is very sensitive to parasitic photons scattered by air and any material in the beam paths.…”

Section: Descriptionmentioning

confidence: 99%

Sample housing for high-energy Compton measurements

Bellin¹,

Frouin²,

Loupias³

1995

J Synchrotron Radiat

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In order to obtain reliable Compton spectra using high-energy photons, the scattered beam must be free of parasitic photons, because of the weakness of the double-differential inelastic cross section. The purpose of the device presented in this paper is to remove photons scattered by air, the sample holder or any other stopper. It has been tested on ESRF beamline 2, which is devoted to materials science.

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“…These spectrometers are based on the Cauchois geometry, which implements a cylindrically curved crystal and a Rowland circle with diameter equal to the radius of curvature of the crystal [1,2]. During inhouse testing of the spectrometer performance using laboratory Mo and W sources, it was noticed that the spectral resolving power increased when the detector was placed beyond the conventionally-employed Roland circle [3].…”

Section: Introductionmentioning

confidence: 99%

Laser-produced MeV electrons and hard X-ray spectroscopic diagnostics

Seely

Hudson

2010

Nuclear Instruments and Methods in Physics Research Section A:

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Keywords: X-ray source size MeV electron propagation K-shell transitions X-ray spectroscopy a b s t r a c t A new spectroscopic technique for the measurement of the sizes of hard X-ray sources produced by the irradiation of solid-density targets by intense laser radiation is discussed. The technique is based on the source broadening of K shell spectral lines from targets irradiated by intense picosecond laser pulses. The spectra are recorded by a modified Cauchois type spectrometer, where the detector is placed far behind the Rowland circle where source broadening dominates instrumental resolution. The laser irradiation with focused intensity greater than 10 18 W/cm 2 produces relativistic electrons that propagate from the focal spot into the surrounding target material with mm range. The energetic electrons produce 1 s electron ionization and K shell radiation with picosecond duration that can be utilized for transient radiography of dense objects including evolving dense plasmas. However, the hard X-ray source has mm lateral size when extended targets are utilized while a much smaller source size (of order 10 mm) is necessary for high-resolution point projection radiography. The lateral source size can be greatly reduced by using targets with limited aspect to the radiography object such as thin foils and wires, but the brightness of these sources is greatly reduced compared to thick planar targets. Studies indicate that the electron range and source size can also be reduced by utilizing an electrically resistive target material such as teflon. In this case the electron propagation from the focal spot is inhibited by a weak return current and incomplete space-charge neutralization. These experimental results are important not only for producing a small hard X-ray source for picosecond radiography but also for reducing the lateral propagation of energetic electrons that can be detrimental to fast-ignition fusion.Published by Elsevier B.V.

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Description d'un tube électronique puissant

Cited by 12 publications

References 0 publications

High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy range

High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy range

Sample housing for high-energy Compton measurements

Laser-produced MeV electrons and hard X-ray spectroscopic diagnostics

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