Der Unterschied zwischen mechanisch und röntgenographisch ermittelten Elastizitätskonstanten

Bollenrath, Franz; Oßwald, Eugen; Möller, Hermann; Neerfeld, Helmut

doi:10.1002/srin.194100586

Cited by 10 publications

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“…diffraction strains differ from mechanical strains due to the intrinsic elastic anisotropy. Diffraction (X-ray) elastic constants were eventually proposed on an empirical basis by Mö ller & Martin (1939) (see also Bollenrath et al, 1941). For the special cases of the Voigt grain-interaction model (Voigt, 1910) and the Reuss grain-interaction model (Reuss, 1929), it was demonstrated that such XECs can be applied (Mö ller & Martin, 1939).…”

Section: Macroscopically Elastically Isotropic and Anisotropicmentioning

confidence: 99%

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

et al. 2005

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The components of the macroscopic mechanical stress tensor of a stressed thin film, coating, multilayer or the region near the surface of a bulk material can in principle be determined by X-ray diffraction. The various analysis methods and measurement strategies, in dependence on specimen and measurement conditions, are summarized and evaluated in this paper. First, different X-ray diffraction geometries (conventional or grazing incidence) are described. Then, the case of macroscopically elastically isotropic, untextured specimens is considered: from the simplest case of a uniaxial state of stress to the most complicated case of a triaxial state of stress. The treatment is organized according to the number of unknowns to be determined (i.e. the state of stress, principal axes known or unknown), the use of one or several values of the rotation angle ' and the tilt angle of the sample, and one or multiple hkl reflections. Next, the focus is on macroscopically elastically anisotropic (e.g. textured) specimens. In this case, the use of diffraction (X-ray) elastic constants is not possible. Instead, diffraction (X-ray) stress factors have to be used. On the basis of examples, it is demonstrated that successful diffraction stress analysis is only possible if an appropriate grain-interaction model is applied.

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Section: Macroscopically Elastically Isotropic and Anisotropicmentioning

confidence: 99%

Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

et al. 2005

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“…the direction-dependent deformation behavior of the crystallites the material is composed of, was recognized and taken into account (see e.g. Glocker, 1938;Mö ller & Martin, 1938;Bollenrath et al, 1941). Based on different assumptions regarding the grain interaction, various models were developed to calculate the diffraction elastic constants (DEC) S 1 hkl and 1 2 S hkl 2 for stress analysis in materials with random crystallographic texture.…”

Section: Introductionmentioning

confidence: 99%