2019
DOI: 10.1016/j.jnucmat.2019.02.008
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Depth synergistic effect of irradiation damage on tungsten irradiated by He-ions with various energies

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Cited by 5 publications
(5 citation statements)
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“…Compared with the 200 keVion irradiated W-2, the S parameters of the sequential-ion irradiated W-3 are reduced in the range of 58-249 nm, as shown in Fig. 3b and c. This is due to the trapping of He atom at vacancy-type defects and the formation of vacancyhelium complexes [3,10]. A turning point between 1073 and 1273 K is observed in all figures, which will be discussed later.…”
Section: Evolution Of the Type And Associated Intensities Of The Vacamentioning
confidence: 78%
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“…Compared with the 200 keVion irradiated W-2, the S parameters of the sequential-ion irradiated W-3 are reduced in the range of 58-249 nm, as shown in Fig. 3b and c. This is due to the trapping of He atom at vacancy-type defects and the formation of vacancyhelium complexes [3,10]. A turning point between 1073 and 1273 K is observed in all figures, which will be discussed later.…”
Section: Evolution Of the Type And Associated Intensities Of The Vacamentioning
confidence: 78%
“…τ m is conducted by the equation Fig. 1 a He-ion irradiation damage (dpa) in W-1, W-2, and W-3 and b the corresponded He atom concentration (at.%) as a function of positron penetration depth (nm) with SRIM calculations which represents the mean positron annihilation lifetime of the effective open volume defects in the whole sample [3,30]. As shown in Tables 2 and 3, the free state positron annihilation intensity reached ~ 99% in both well-annealed W and W5Re.…”
Section: Evolution Of the Type And Associated Intensities Of The Vacamentioning
confidence: 99%
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“…The S parameters at the positron energy less than 2 keV are relatively large, which would be contributed to two factors. One is that the low-energy positrons have shallow injection depth, the other is that the positrons after thermalizing diffuse to the surface and annihilate with the electrons in the surface [36]. The H or He ions with relative high (dozens of keV) energies irradiated the samples, resulting in the production of a lot of vacancy-type defects, which can be informed from the SRIM simulation.…”
Section: Db-spba Analysismentioning
confidence: 99%