Depth-resolved stress field measurement of multilayered system using swept-source polarization-sensitive optical coherence tomography

Zhang, Xinya; Chen, Jinlong; Sun, Cuiru

doi:10.1016/j.optlaseng.2024.108215

Optics and Lasers in Engineering

2024

DOI: 10.1016/j.optlaseng.2024.108215

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Depth-resolved stress field measurement of multilayered system using swept-source polarization-sensitive optical coherence tomography

Xinya Zhang,

Jinlong Chen,

Cuiru Sun

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Depth-resolved stress field measurement of multilayered system using swept-source polarization-sensitive optical coherence tomography

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References 32 publications

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