Depth-Resolved Residual Stress Analysis with High-Energy Synchrotron X-Rays Using a Conical Slit Cell

Abstract

A conical slit cell for depth-resolved diffraction of high-energy X-rays was used for residual stress analysis at the high-energy materials science synchrotron beamline HEMS at PETRA III. With a conical slit width of 20 µm and beam cross-sections of 50 µm, a spatial resolution in beam direction of 0.8 mm was achieved. The setup was used for residual stress analysis in a drawn steel wire with 8.3 mm diameter. The residual stress results were in very good agreement with results of a FE simulation.

Locally resolved stress and strain analysis of sinter-joined micro valves using synchrotron X-ray diffraction and conical slit apertures

“…Therefore, test measurements using an iron sheet of known depth have been performed: the sheet was moved in defined steps towards the conical slit and the positions of the appearing and disappearing Debye-Scherrer rings were noted. hence, the lateral length of the gauge volume was verified to be 800 µm resulting in a total gauge volume of about (Staron et al 2013). Simultaneously, the coordinates of the gauge volume in relation to the conical slit were determined.…”

“…apart from a small beam diameter, a conical slit (Garbe et al 1996;Staron et al 2013;nielsen 2000) is required to achieve also depth resolution. These requirements are met at the high-energy materials science (heMS) beamline P07 at PeTra III, DeSY.…”

The role of ceramic and glass science research in meeting societal challenges: Report from an NSF‐sponsored workshop

“…In situ measurements of material characteristics and operando monitoring of materials evolution are critically needed to enable a quantitative understanding of the composition‐structure‐property relations in a complex environment. Using X‐rays as probes, especially in combination with μ‐CT, one should be able to assess the synergistic effects of temperature, environment, and stress on the mechanical properties and the mechanisms of failure, phase stability, oxidation, oxidation‐induced stresses, and effects of high‐temperature corrosion by CMAS and gradients in internal strain …”

“…Using X-rays as probes, especially in combination with l-CT, one should be able to assess the synergistic effects of temperature, environment, and stress on the mechanical properties and the mechanisms of failure, 219,220,234 phase stability, oxidation, oxidation-induced stresses, 235 and effects of high-temperature corrosion by CMAS 236,237 and gradients in internal strain. 238…”

Diffraction analysis of strongly inhomogeneous residual stress depth distributions by modification of the stress scanning method. I. Theoretical concept

“…Besides the formation of very small gauge volumes through specific slit systems (Nielsen et al, 2000;Martins et al, 2010;Meixner et al, 2013b;Staron et al, 2013) or masking of the sample surface (Predecki et al, 1993;Manns et al, 2006Manns et al, , 2009, another possibility exists to reduce the probed sample volume. In order to analyze the properties of materials in a very local manner, a highly focused synchrotron beam can be employed at synchrotron beamlines providing a micro-and/or nanobeam option (Ice et al, 2011).…”