Depth profiling of anodic tantalum oxide films with gold cluster ions

Poerschke, David L.; Wucher, A.

doi:10.1002/sia.3441

Cited by 4 publications

(4 citation statements)

References 16 publications

(13 reference statements)

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“…approximated by Au + at 7.5 and 5 keV respectively. This method for approximating cluster ion sputtering has been shown to be valid for materials with large sublimation energies where the nonlinear sputter yield enhancements are small [31]. Although it is not possible to make a direct comparison to the experimental results, the data provided by the SRIM calculation provides valuable insight into the mechanism of energy transfer between the primary ion and the target atoms.…”

Section: Resultsmentioning

confidence: 99%

RIMS analysis of ion induced fragmentation of molecules sputtered from an enriched U3O8 matrix

Willingham

Savina

Knight

et al. 2012

J Radioanal Nucl Chem

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Section: Resultsmentioning

confidence: 99%

RIMS analysis of ion induced fragmentation of molecules sputtered from an enriched U3O8 matrix

Willingham

Savina

Knight

et al. 2012

J Radioanal Nucl Chem

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“…These ratios can also vary on the uppermost surface being analyzed vs. what constitutes the bulk, or the equilibrium measurement beneath the surface. ToF-SIMS is routinely used as a depth-profiling tool to monitor the distributions of chemical species vs. depth, [17][18][19][20][21][22][23][24] but those analyses are often interested in chemical changes over tens to hundreds of nanometers. The three-dimensional orientation of NP aggregates studied here, with all individual NP diameters under 20 nm, requires a more surface-sensitive approach than what is generally eroded in each analysis cycle in traditional depth profiling experiments.…”

Section: Towards Monitoring Differences In Surface Chemistry Of Depos...mentioning

confidence: 99%

Preparation and measurement methods for studying nanoparticle aggregate surface chemistry

et al. 2012

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Despite best efforts at controlling nanoparticle (NP) surface chemistries, the environment surrounding nanomaterials is always changing and can impart a permanent chemical memory. We present a set of preparation and measurement methods to be used as the foundation for studying the surface chemical memory of engineered NP aggregates. We attempt to bridge the gap between controlled lab studies and real-world NP samples, specifically TiO(2), by using well-characterized and consistently synthesized NPs, controllably producing NP aggregates with precision drop-on-demand inkjet printing for subsequent chemical measurements, monitoring the physical morphology of the NP aggregate depositions with scanning electron microscopy (SEM), acquiring "surface-to-bulk" mass spectra of the NP aggregate surfaces with time-of-flight secondary ion mass spectrometry (ToF-SIMS), and developing a data analysis scheme to interpret chemical signatures more accurately from thousands of data files. We present differences in mass spectral peak ratios for bare TiO(2) NPs compared to NPs mixed separately with natural organic matter (NOM) or pond water. The results suggest that subtle changes in the local environment can alter the surface chemistry of TiO(2) NPs, as monitored by Ti(+)/TiO(+) and Ti(+)/C(3)H(5)(+) peak ratios. The subtle changes in the absolute surface chemistry of NP aggregates vs. that of the subsurface are explored. It is envisioned that the methods developed herein can be adapted for monitoring the surface chemistries of a variety of engineered NPs obtained from diverse natural environments.

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“…In molecular SIMS analysis, post-ionization (also known as secondary neutral mass spectrometry) is generally achieved through laser post-ionization (LPI). Up to now the technique has been used in a wealth of experiments, including the detection of trace elements, polyaromatic hydrocarbons, molecules in tissues and cells [18][19][20], the depth profiling of thin films [21], and fundamental studies of the sputtering process [22] to name a few.…”

Section: Introductionmentioning

confidence: 99%

Quantitative Surface Analysis of a Binary Drug Mixture—Suppression Effects in the Detection of Sputtered Ions and Post-Ionized Neutrals

Karras

Lockyer

2014

J. Am. Soc. Mass Spectrom.

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A systematic mass spectrometric study of two of the most common analgesic drugs, paracetamol and ibuprofen, is reported. The drugs were studied by means of secondary ion mass spectrometry (SIMS) and secondary neutral mass spectrometry (SNMS) using laser post-ionization (LPI) both in pure samples and in a two-component mixture. Ion suppression within the two-component system observed in SIMS mode is ameliorated using LPI under room temperature analysis. However, suppression effects are apparent in LPI mode on performing the analysis at cryogenic temperatures, which we attribute to changes in the desorption characteristics of sputtered molecules, which influences the subsequent post-ionization efficiency. This suggests different mechanisms of ion suppression in SIMS and LPI modes.

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Depth profiling of anodic tantalum oxide films with gold cluster ions

Cited by 4 publications

References 16 publications

RIMS analysis of ion induced fragmentation of molecules sputtered from an enriched U3O8 matrix

RIMS analysis of ion induced fragmentation of molecules sputtered from an enriched U3O8 matrix

Preparation and measurement methods for studying nanoparticle aggregate surface chemistry

Quantitative Surface Analysis of a Binary Drug Mixture—Suppression Effects in the Detection of Sputtered Ions and Post-Ionized Neutrals

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