Depth profiling analysis of solar wind helium collected in diamond-like carbon film from &lt;i&gt;Genesis&lt;/i&gt;

Bajo, K.; Olinger, C. T.; Jurewicz, A. J. G.; Burnett, D. S.; Sakaguchi, Isao; Suzuki, Taku; Itose, Satoru; Ishihara, Morio; Uchino, Kenji; Wieler, R.; Yurimoto, H.

doi:10.2343/geochemj.2.0385

Cited by 16 publications

(29 citation statements)

References 16 publications

(21 reference statements)

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“…That is, there are more counts per nA deeper in the DLC than near the surface. This result might be expected because the ion intensities were collected in the non-steady-state (transient) sputtering regime shortly after the beginning of the analysis as illustrated for the standard in Figure 8 SW 24 Mg, 25 Mg, and 26 Mg (cps) each normalized to 12 Fig 5a, b). Mg-rich surface contamination (e.g., particulates) is obvious during analyses due to low SW Mg concentrations, cf., Fig.…”

Section: Sw Matrix Resultsmentioning

confidence: 99%

“…Moreover, the matrix intensities are stable; there are no precipitous changes in intensity-what you would expect for matrix depth profiles in a homogeneous material. However, for the zone of transient (nonequilibrium) 12 C ? sputtering (RHS of Fig.…”

Section: Matrix Resultsmentioning

confidence: 99%

“…This difference in analytical method for measuring matrix ions was adopted because the SW Mg signal is a fraction of that from the 26 Mg implant, and removing matrix ion analyses increased the fraction of the SIMS duty cycle spent measuring Mg. Unless otherwise stated, the matrix ion value used in plots is 12 inital , the average of the data taken at the beginning of the analysis, are averaged signals collected prior to the crater floor reaching steady-state conditions (cf., [22] and Figs. 5, 6).…”

Section: Solar Wind Resultsmentioning

confidence: 99%

“…The observed peak concentration of H depth profiles in DLC is *12.0-14.0 nm below the surface [3]; the peak He concentration was *20.0-23.0 nm [2]. These parameters were monitored by instruments aboard the Genesis spacecraft as well as other in situ spacecraft ( [2] and references therein) so that the energy spectrum of the SW implant is known (e.g., [12,13]). …”

Section: The Genesis Sw Samplementioning

confidence: 99%

“…Sputtering rates reported are the depths of analytical pits divided by the total time for the analysis. 12 C, 12 C 2 , 24 Mg, 25 Mg, and 26 Mg were collected sequentially by mass peak jumping. That is, only one species of ion was counted at a time: the signal of each ion reported for the ''duty cycle'' of the SIMS analysis (cf., RSF, ''Analysis by secondary ion mass spectroscopy'' in Background) is based upon the fraction of time that species was counted during that analytical cycle.…”

Section: Details Of Measurementmentioning

confidence: 99%

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Understanding heterogeneity in Genesis diamond-like carbon film using SIMS analysis of implants

et al. 2017

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An amorphous diamond-like carbon film deposited on silicon made at Sandia National Laboratory by pulsed laser deposition was one of several solar wind (SW) collectors used by the Genesis Mission (NASA Discovery Class Mission #5). The film was *1 lm thick, amorphous, anhydrous, and had a high ratio of sp 3 -sp 2 bonds ([50%). For 27 months of exposure to space at the first Lagrange point, the collectors were passively irradiated with SW (H fluence *2 9 10 16 ions cm -2 ; He fluence *8 9 10 14 ions cm -2 ). The radiation damage caused by the implanted H ions peaked at 12-14 nm below the surface of the film and that of He about 20-23 nm. To enable quantitative measurement of the SW fluences by secondary ion mass spectroscopy, minor isotopes of Mg ( 25 Mg and 26 Mg) were commercially implanted into flight-spare collectors at 75 keV and a fluence of 1 9 10 14 ions cm -2 . The shapes of analytical depth profiles, the rate at which the profiles were sputtered by a given beam current, and the intensity of ion yields are used to characterize the structure of the material in small areas (*200 9 200 ± 50 lm). Data were consistent with the hypothesis that minor structural changes in the film were induced by SW exposure.

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Section: Sw Matrix Resultsmentioning

confidence: 99%

Section: Matrix Resultsmentioning

confidence: 99%

Section: Solar Wind Resultsmentioning

confidence: 99%

Section: The Genesis Sw Samplementioning

confidence: 99%

Section: Details Of Measurementmentioning

confidence: 99%

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Understanding heterogeneity in Genesis diamond-like carbon film using SIMS analysis of implants

et al. 2017

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Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low‐fluence, shallow implants in diamond‐like carbon

Rieck

Jurewicz

Hervig

et al. 2023

Rapid Comm Mass Spectrometry

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Back-side thinning of wafers is used to eliminate issues with transient sputtering when analyzing near-surface element distributions. Precise and accurate calibrated implants are created by including a standard reference material during the implantation. Combining these methods allows accurate analysis of low-fluence, shallow features even if matrix effects are a concern.Methods: Implanted Na (<2.0 Â 10 11 ions/cm 2 , peaking <50 nm) in diamond-like carbon (DLC) film on silicon (solar wind returned by NASA's Genesis mission) was prepared for measurement as follows. Implanted surfaces of samples were epoxied to wafers and back-side-thinned using physical or chemical methods. Thinned samples were then implanted with reference ions for accurate quantification of the solar wind implant. Analyses used a CAMECA IMS 7f-GEO SIMS in depthprofiling mode.Results: Back-side-implanted reference ions reduced the need to change sample mounts or stage position and could be spatially separated from the solar wind implant even when measuring monoisotopic ions. Matrix effects in DLC were mitigated and the need to find an identical piece of DLC for a reference implant was eliminated. Accuracy was only limited by the back-side technique itself.Conclusions: Combining back-side depth profiling with back-side-implanted internal standards aides quantification of shallow mono-and polyisotopic implants. This technique helps mitigate matrix effects and keeps measurement conditions consistent. Depth profile acquisition times are longer, but if sample matrices are homogeneous, procedural changes can decrease measurement times.

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High spatial resolution imaging of helium isotope by TOF‐SNMS

Bajo

Itose

Matsuya

et al. 2016

Surface & Interface Analysis

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Laser ionization mass nanoscope is a time-of-flight sputtered neutral mass spectrometer associated with laser post-ionization by tunneling effect. A spherical and chromatic aberration corrector is installed in the primary ion column. The lateral spatial resolving power of He imaging of solid surface has been evaluated by scanning image using a probe diameter of 90 nm from crater edge slope of a He ion-implanted Si substrate. Helium distribution from the scanning image is quantitatively equivalent with depth profiling analysis from surface of the same substrate, indicating that spatial resolving power of 20 nm for depth resolution has been achieved on the He scanning image through use of oblique incident effect of the primary beam.

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Depth profiling analysis of solar wind helium collected in diamond-like carbon film from <i>Genesis</i>

Cited by 16 publications

References 16 publications

Understanding heterogeneity in Genesis diamond-like carbon film using SIMS analysis of implants

Understanding heterogeneity in Genesis diamond-like carbon film using SIMS analysis of implants

Depth profiling and standardization from the back side of a sample for accurate analyses: Emphasis on quantifying low‐fluence, shallow implants in diamond‐like carbon

High spatial resolution imaging of helium isotope by TOF‐SNMS

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