2000
DOI: 10.1007/s002160000417
|View full text |Cite
|
Sign up to set email alerts
|

Depth profile analysis of various titanium based coatings on steel and tungsten carbide using laser ablation inductively coupled plasma - "time of flight" mass spectrometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
57
0
1

Year Published

2001
2001
2014
2014

Publication Types

Select...
4
4

Relationship

0
8

Authors

Journals

citations
Cited by 68 publications
(59 citation statements)
references
References 0 publications
1
57
0
1
Order By: Relevance
“…36 In particular, the flat-top beam profile of the 193 nm ArF excimer laser used in this work is ideal for this kind of application, as documented in previous works. [37][38][39] In principle, by using an output energy significantly exceeding the threshold and a sufficiently wide laser beam diameter, it is possible to obtain representative compositional data throughout the process of ablation, as long as a value of 6 for the depth/ diameter ratio is not exceeded, 34 although for this particular laser system it has been recommended not to exceed a depth/diameter ratio of 1.5, in order to achieve uniform flat-bottomed craters. 40 The examination of the craters obtained after ablation of the samples by SEM permitted us to estimate that the penetration depth obtained after firing 600 pulses varied between 21 and 27 µm, corresponding to approximately 40 nm of penetration per pulse.…”
Section: Resultsmentioning
confidence: 99%
“…36 In particular, the flat-top beam profile of the 193 nm ArF excimer laser used in this work is ideal for this kind of application, as documented in previous works. [37][38][39] In principle, by using an output energy significantly exceeding the threshold and a sufficiently wide laser beam diameter, it is possible to obtain representative compositional data throughout the process of ablation, as long as a value of 6 for the depth/ diameter ratio is not exceeded, 34 although for this particular laser system it has been recommended not to exceed a depth/diameter ratio of 1.5, in order to achieve uniform flat-bottomed craters. 40 The examination of the craters obtained after ablation of the samples by SEM permitted us to estimate that the penetration depth obtained after firing 600 pulses varied between 21 and 27 µm, corresponding to approximately 40 nm of penetration per pulse.…”
Section: Resultsmentioning
confidence: 99%
“…Exceptional attributes of ICP-TOF-MS, such as high speed of data acquisition, an ability to obtain a full elemental analysis in a time-frame suited to a transient inlet system and significantly better, as compared with widely used quadrupole ICP-MS, the precision of the measurements generate increasing interest in the technique. The ICP-TOF-MS has been successfully coupled to LA, [120][121][122][123][124][125][126] ETV, 127 GC, [128][129][130][131][132] liquid chromatography, 133,134 CE 135,136 and FIA. [137][138][139][140][141] Detailed reviews of the development and analytical performance of TOF-MS combined with ICP ion source have been presented.…”
Section: An Overview Of Analytical Applications Of Tof-ms Analyzersmentioning
confidence: 99%
“…[120][121][122][123][124][125][126] A detection limit of 10 ppb for lead in a cast-iron standard has been reported from integration of a 0.3 s transient signal generated by a single laser pulse. 120 The opimization of various ICP-TOF-MS parameters for laser-induced aerosols and for the analysis of tin-rich fluid inclusions has been described.…”
Section: Applications Of Icp-tof-ms Technique In Elemental Analysismentioning
confidence: 99%
See 1 more Smart Citation
“…[7][8][9][10] The real advantage, however, is the ability of the technique to provide information on spatial distribution in all three dimensions, dealing with inhomogeneous samples. The changing transient signals can provide information about the presence of heterogeneities, although the time delay in the sample transport system (including the sample cell volume) is a limiting factor, causing signal mixing during the transportation of the ablated material, and preventing accurate identification of the exact origin of every signal.…”
Section: Introductionmentioning
confidence: 99%